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  • VEBKO

  • Introducing the Company and Products
    • Assembling Stages of AMT105 Tester
    • Disperesing Stages of AMT Tester
    • Introducing the Device and Equipment
    • Comparative Analysis of AMT105, AMT205, AMT103, and AMT203 Devices
    • AMPro Software Translation
  • Software Installation and Connection Setting
    • Software Installation
    • How to Connect to AMT
    • Simultaneous Connection of Several Testers
    • Resetting IP Address
    • Updating Firmware of Device Manually
  • Default Setting
    • General Setting of Rooms
    • General Setting of Rooms, Part2
    • Default Setting for “Report”
    • Preferences Page "Directory" & "Cash" Tab
    • "Connection & Firmware"Tab
    • Device Hardware Setting
    • Modifying and Improving the Translation of the Vebko Amirkabir Company Website
    • Power Control and Its Relation to Heat
    • Modifying and Improving AMPro Software Translation
  • Software Home Page
    • General Types of Rooms
    • Software Start Page
  • Modules Toolbar and Statusbar
    • Toolbar and Status Bar, Part 1
    • Toolbar and Status Bar, Part 2
    • “New Based on Custom Template” Option
    • Determining Decimal Numbers, Part 1
    • Determining Decimal Numbers Part 2
    • Analog Output Setting
    • Binary Input Setting, Part1
    • Binary Input Setting, Part2
    • Binary Output’S Setting
    • Extra Setting
    • Relay Specification in Test Object
    • Introducing the “RIO”
    • Introducing “XRIO”
    • XRIO Converter File
    • XRIO Converter, Part2
    • Complementary Explanation About “XRIO Converter”
    • XRIO and XRIO Converter
    • XRIO & Relay Setting in the Software
    • XRIO Converter Formula Writing
    • Writing “XRIO Converter” for an Overcurrent Relay
    • Writing Formula for the “XRIO Converter” 3
    • Writing Formula for “XRIO Converter”4
    • Writing Formula for “XRIO Converter”5
    • Complementary Explanations of “Device” Section
  • AMT Sequencer Module
    • An Introduction to the Sequencer Room
    • “Table View” Window
    • The Separate Toolbar of “Table View” Window
    • “Detail View” Tab
    • Analog Out Tab
    • Quick Type
    • Step Ramp Type
    • Continuous Ramp Type
    • Harmonic State
    • The “Transient” State Type:
    • The “Transient” State (Observing the Impedance Trajectory)
    • The "Transient" State (Observing the Differential Trajectory)
    • “Tracking” State
    • "Set Mode and Fault Type" : Part 1
    • "Set Mode and Fault Type" : Part 2
    • Additional Settings of “Detail View”
    • "Signal View" Window Part 1
    • “Signal View” Window, Part 2
    • “Signal View” Setting, Part 1
    • “Signal View” Setting, Part 2
    • ”Vector View” Window, Part 1
    • “Vector View” Window, Part 2
    • “Vector View” Window, Part 3
    • “Measurement View” Window, Part1
    • “Level Assessment” Tab
    • “Ramp Assessment” Tab
    • “Value Assessment” Tab
    • “Calculated Assessment” Tab
    • "Transient Assessment" Tab
    • Running the Test
    • Start-Condition-Repetition" Window
    • “Report Setting” Window
    • “Report View” Window
    • Advanced Settings of “Report” Part 1
    • Advanced Settings of “Report” Part 2
    • Abilty to Convert Output Binary Voltage to Current and Vice Versa
    • Sampled Value
  • AMT Overcurrent Module
    • Introducing Over Current Room
    • Relay Settings in the "Overcurrent" Room – Part 1
    • Relay Settings in the "Overcurrent" Room – Part 2
    • Relay Settings in “Overcurrent” Room, Part 3
    • Relay Settings in the "Overcurrent" Room – Part 4
    • Test View Window
    • “Pick Up-Drop Off” Window
    • “Overcurrent” Characteristic Curve
    • “Settings” Tab of “Overcurrent” Module, Part 1
    • “Settings” Tab of “Overcurrent” Module, Part 2
    • Directional Earth Fault
    • Complementary Explanation of “Overcurrent” Room
    • Directional Overcurrent
  • AMT VI STARTING Module
    • Introducing “VI Starting” Room
    • “Shot Test” Tab
    • “Check Test” Tab
    • "VI Starting" Room Setting
  • AMT Distance Module
    • Introducing “Distance” Room, Part 1
    • Introducing “Distance” Room, Part 2
    • Introducing “Distance” Room, Part 3
    • Introducing “Testview” Window in “Distance” Room, Part 1
    • “Check Test” Tab
    • “Search Test” Tab
    • “Distance” Room Settings, Part 1
    • “Distance” Room Settings, Part 2
    • Impedance View Window
    • “Zt Diagram” and “Medium Detail View” Windows
    • Grounding Factor in Distance
    • Distance Protection Voltage and Current Calculations in the Test Room
  • AMT Differential Module
    • Relay Settings in “Differential” Room, Part 1
    • Relay Settings in “Differential” Room, Part 2
    • Introducing “Test View” Window in “Differential” Room, Part 1
    • Introducing “Test View” Window in “Differential” Room, Part 2
    • “Differential” Room Settings
    • “Differential Characteristic” Window
    • No Combined Characteristic
    • Zero Sequence Elimination
    • Restricted Earth Fault
  • AMT Diff Harmonics Module
    • Introducing “AMT Diff. Harmonics” Room
    • “Test View” Window
    • “Setting” Tab
    • “Harmonic Restraint View” Window
  • AMT Transducer Module
    • “Offload” Test Part 1
    • “Offload” Test Part 2
    • “Onload” Test of the Meter
    • Transducer Test
    • How to Use the Optical Pulse Sensor in Meter Testing
  • AMT Synchronizer Module
    • An Introduction to AMT Synchronizer
    • Test View Window in Synchronizer Room
  • AMT VCC Room
    • AMT VCC Room
  • Current Transformer Module
    • Introducing “Current Transformer (CT)” Room
    • Secondary Burden Test
    • Winding Resistance Test
    • “Excitation Test” Tab, Part 1
    • “Excitation Test” Tab, Part 2
    • CT “Excitation Test”, Part 3
    • CT Excitation Test, Part 4
    • Other Tests Performable in “Excitation Test” Tab
    • CT Ratio and Polarity Test with Current Method
    • CT Ratio and Polarity Test (with Voltage)
    • CT Test Wiring Guide Using the Instrument Module
    • CT and PT Turns Ratio
    • Estimating FS and ALF for Various CTs
  • Circuit Breaker Module
    • Introducing “Circuit Breaker(CB)” Room
    • CB “Timing Test”
    • “Contact Resistance” Tab
    • Circuit Breaker Operation Minimum Voltage Test:
    • A Guide for Performing CB Test Connections Using the Instrument Module
  • capacitor voltage transformer
    • Capacitive Voltage Transformers
    • Secondary Burden Test
    • Short-Circuit Impedance Tab
    • Winding Resistance Test
    • Excitation Tab
    • CVT Ratio2
    • Ratio Tab
    • A Guide for Cvt Test Wiring Using the Instrument Module
  • Transformer Module
    • Introducing “Transformer” Room
    • “Vector Group, Turns Ratio and No Load” Tab
    • “Magnetic Balance” Tab
    • “Winding Resistance” Tab
    • “Leakage Reactance“ Tab
    • “Demagnitize” Tab
    • Guide to Performing Transformer Test Using Instrument Module
    • Zero Sequence Elimination
    • How to Use Clamps in Transformer Testing
  • OverCurrent Quick Test Room
    • Overcurrent Quick Test Room
  • Under OverVoltage Test Room
    • Under Over Voltage Test Room
  • AMT AR Room
    • AMT Ar Room
  • Resistance Test
    • Resistance Test
  • Troubleshooting
    • The Complete Main Switching
    • Main Switching Error Overcurrent Board
    • Overcurrent Error of Board 2 Part 1
    • Overcurrent Error Board 2 Part2
    • Switching Troubleshooting
    • OC Board IGBT Test
    • Introducing the Internal Modules Part1
    • Introduceing Internal Modules Part2
    • Introducing Internal Modules Part3
    • Switching Module
    • Possible Errors in the Switching Module
    • Checking the Parts,in Switching Module Errors Part1
    • Checking the Parts,in Switching Module Errors Part2
    • Checking the Parts,in Switching Module Errors Part3
    • The Connections Between the Switching Module and the Amplifier
  • Testing of relays protection functions
    • End-to-End Test
    • Overvoltage Protection Function Test in MICOM P141 Relay
    • Undervoltage Protection Function Test in MICOM P141 Relay
    • Directional Overcurrent Protection Function Test in MICOM P141 Relay
    • Directional Earth Fault (DEF) Protection Function Test in MICOM P141 Relay
    • New End-to-End Test
    • Drawing the Distance Characteristics and Practical Example of Drawing the Quad Characteristic in Siemens 7SA522 Relay
    • Drawing the Load Encroachment Characteristic
    • Drawing the Mho Characteristic in GEC PYTC Relay
    • Synchronizer Function Test in SIPROTEC Siemens 7SD82 Relay
    • 51V Function Test in Siemens 7SD82 Relay
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Rogowski Coil Test
  • ZA
  • Goose Messaging Testing
    • GOOSE Messaging Testing
  • Trust the Software
    • Guide to Trusting Vebko(Stable-Test) Software in Bitdefender Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in Kaspersky Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in NOD32 Antivirus
  • PMU Test
    • PMU Test
  • ZE
  • Introdusing Company and Produces
    • Assembly Stages of AMR Relay
  • Software Download and Installation
    • Software Installation
  • Software Homepage and Create Project
    • Login to the Main Environment of the Software
  • Connection and Update Firmware
    • Connect with Relay
    • Firmware Relay Update
  • Relay Hardware
    • Relay Hardware Module
    • Voltage and Current Transformers Data
  • AMR Relay Test
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
  • Real Testing Requires Realistic Signals
  • AMPro Protocol Sniffer
  • Meet SV100+
  • IEC 61850 Sampled Values Testing
  • Digital substations run at the speed of light
  • Don’t Just Test Your Relays. Simulate the Grid
  • Smart Configuration Inheritance in VCC — With Full Control
  • Control What Appears in Your Test Report
  • From Comtrade to Inject
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • One State. Four Transitions. Total Control
  • Stop waiting for the test to finish
  • Balanced System, Zero Trip, Infinite Confidence
  • Defining Complex Logic For Assessments
  • Advanced Assessments
  • Vebko Around The World
  • Noise Suppression in Transformer Turns Ratio
  • Relay Data in Quick Access
  • Wiring Clarity - Without Leaving Your Workspace
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • Flexible Connectivity with AMT205 in AMPRO
  • Simultaneous Ramp on All Outputs [AMT205]
  • Continuous Ramp Capability [AMT205]
  • Distance Search Testing
  • Comprehensive Circuit Breaker Testing [AMT205]
  • Smarter Configuration In VCC File
  • New Feature In Vebko AMPro
  • Vebko Educational Videos
  • Contact Resistance Measurement
  • Test With Confidence
  • Control Your Report
  • One Device, Any Relay
  • DC Resistance Measurement
  • History of Amt105 GPS
  • History of Amt105 Wifi
  • AMT 105 Features
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    Analog Out Tab

    In the beginning of this video, we close the “Measurement View” window and change the size of other windows. In “State Type” section, the type of “State” is selected from the “State Type” dropdown field and in the “State Name” field a name (Vebko) is selected for the “State”.

    In “Set Mode and Fault Type” section, the outputs of the device are specified according to parameters and types of faults. For example, in “Direct” mode, the output voltage and current of the device are determined directly but in “Line-Line” mode, the user specifies values of the line voltage and the zero sequence voltage, and the device produces the output voltage and current values in accordance with those other values. It should be noted that in this video, the instruction is done in “Direct” mode and descriptions about different “Set Modes” will be provided in future videos.

    In “Binary Outputs” box, the state of binary Outputs of the device are specified where the user can enable or disable any binary according to the condition of the test. Moreover, from the “Binary Out” tab the user can adjust the settings related to binary Outputs in more details.

    In “Binary Inputs” section, the state of active binaries of the device and the reception time of contact is specified.  “Trigger setting” section: In “Comment” field, the user can add a note about the current “State”. This note is, also, viewable from the “Table View” window, “Comment” field. In “State Termination” section, the user determines the conditions for termination of the current “State” and initiation of the next “State”. In “Timeout” field, the signal injection time is determined by the user and after that the test ends or goes to the next “State”.

    If the user wishes to specify conditions to terminate the current “State” according to reception of “Pickup” and “Trip” signals from the relay, they need to use the “Use binary trigger condition as specified below” option. To do this, first, the needed binaries should be enabled from the “Hardware Configuration” page. Then, in “Binary Trigger Condition” section, the condition of each binary for terminating the current “State” is specified. The conditions that the user can use are mentioned in the slide bar in front of each contact.

    Condition “0”, no contact has been received by the binary. Condition “1”, the binary, has received “Pick Up” or “Trip” contact. Condition “0 -> 1”, the binary is first in “0” condition (no contact received) and then “Pick up” or “Trip” contact is received. In this condition, it is necessary for the binary to detect “0” to “1” signal. Condition “1 -> 0”, the binary is, at first, in condition “1” (contact received) and then the contact is removed from the binary. In this condition, it is necessary for the binary to detect “1” to “0” signal. Condition “1 -> 0”. “0 -> 1”, if the binary detects any of the conditions “0 -> 1” or “1 -> 0”, the termination command of “State” is made. Condition “X” means there is no condition determined for “State” termination of this binary. It should be noted that if more than one condition is determined for “State” termination, the user needs to choose one logic from “AND” and “OR” logics from the “Trigger Logic” section to apply to the determined conditions. By using the “AND” logic, to terminate the “State” all conditions should be met while by using “OR” logic, if any of the conditions is met, the “State” is terminated.

    It should be noted that all this setting can be adjusted in “Binary Inputs” box by checking “Trigger Condition”. In this section in “Detail View” window, by checking “Show Time from this State” option, the contact reception time origin since the current “State” started is specified. Also, if you wish only for the last binaries state change to be displayed, check “Show only last change” and select one from among “1”, “0” and “0&1” radio-buttons in accordance with your needs. “0&1” option displays the last state of zero and one. It should be reminded that in the default mode of the software, if the binary is open circuited, it means that no contact is received and when the two ends of the binary are short circuited it means that contact has been received. This setting can be adjusted by changing the value of each binary from “True” to “False” in “Reverse” column of the “Hardware Configuration” page.

    For example, from the “Hardware Configuration” window and “Binary / Analog Input”, 6 binaries are selected with specific active “Targets”. Then, in “Trigger” section, the conditions of the binary are set at "0"، "1"،"1 ˃˗ 0"، 0 ˃˗ 1، 0 ˃˗ 1 . 1 ˃˗ 0 and X and “OR” is selected as the logic between them. In this case, by fulfilling any of condition, the current state is terminated but if “AND” logic is selected, all conditions must be fulfilled for the “State” to be terminated.

    Note that in “State Termination” section, between “Time Out”, “Space Key Press” and “Use Binary trigger condition as specified below” there is an “OR” logic and if they are selected simultaneously, if any of the conditions is fulfilled , the current “State” is terminated. By using “Trigger Logic Minimum Time”, the user specifies that how long the determined condition should last for the “State” to be terminated. It should be noted that this feature only works on conditions “1” and “0”.

    In the field related to “Delay after Binary Trigger”, the user makes a delay time between when the condition is fulfilled and when the “State” is terminated. For example, to simulate key performance delay, if 50 milliseconds is entered in this field, the current “State” is terminated after a 50 milliseconds delay and the key cutoff time is simulated. View videos of “Synchronizer Room” to see how “Synchronizer Mode” works.

    In “Other Setting” section, by checking “Disable Error Other”, errors of “Other” type are disabled in the current “State”. Also, by checking “Disable Error Overvoltage of Binary”, the “Overvoltage” errors of the analog binary inputs of the device are disabled in the current “State”.

    In the "Error/Trigger Overcurrent" box a condition for the software overcurrent error or the termination of the state in case high current extraction is specified. By selecting "Overcurrent trigger" if the current extracted is more than 2A from the device, current state terminate. Therefore the software applies the next "state" and if it’s the last "state" the test ends without giving any error message.

    In “Overcurrent” section, the user adjusts the settings related to “Overcurrent” error of the outputs of the voltage outputs. Note that the maximum current of each output is 400 milliamps and 2amps in transient state. In the field related to “Percent Error Overcurrent”, the maximum voltage output current is specified in percent and in the field related to “Threshold Error Overcurrent”, the maximum output current is specified as a number for the “Overcurrent” error. For example, if in the “Percent Error Overcurrent” field 90 percent is entered, if the output current of the device reaches to 90 percent of the voltage output current, which is 1.8 amps, the device errors. Also, if in the “Threshold Error Overcurrent” field, 1 amps is entered, as soon as the current drawn from the voltage outputs exceeds 1 amps, the “Overcurrent” error is displayed and the test stops.

    “Disable Relay” section: Generally, the device works in a way that there are relays embedded behind all current and voltage outputs of the device. Before the test, all amplifiers of the device are off and all relays are open. By “Running” the test, the amplifiers turn on in 20 milliseconds, then, for 20 milliseconds the device produces a 60 volts voltage and 5 amps current and then examines that there is no “Self-calibration” error. After that, for 20 milliseconds, zero current and voltage are produced behind the current and voltage outputs. After these steps, the relays close. Now, after 100 milliseconds, the voltage and current of the test are created. By doing this before the test, the device is isolated from any outside voltage. Also, the amplifiers are off and the device is silent.

    By checking the box next to the title of every output in each “State”, the related relay opens and no more voltage or current is sent to the outputs. For example, to test “Magnetic Balance” of the transformer, it is necessary to open circuit some wiring in some state which it is done by disabling the relay of the related phase in the device.

     [jg1]Analog_out_tab

    Related topics

    • Quick Type AMT Sequencer Module
    • Start-Condition-Repetition" Window AMT Sequencer Module
    • “Measurement View” Window, Part1 AMT Sequencer Module
    • “Table View” Window AMT Sequencer Module
    • “Ramp Assessment” Tab AMT Sequencer Module
    • “Report Setting” Window AMT Sequencer Module
    • "Transient Assessment" Tab AMT Sequencer Module
    • Undervoltage Protection Function Test in MICOM P141 Relay Testing of relays protection functions
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