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  • VEBKO

  • Introducing the Company and Products
    • Assembling Stages of AMT105 Tester
    • Disperesing Stages of AMT Tester
    • Introducing the Device and Equipment
    • Comparative Analysis of AMT105, AMT205, AMT103, and AMT203 Devices
    • AMPro Software Translation
  • Software Installation and Connection Setting
    • Software Installation
    • How to Connect to AMT
    • Simultaneous Connection of Several Testers
    • Resetting IP Address
    • Updating Firmware of Device Manually
  • Default Setting
    • General Setting of Rooms
    • General Setting of Rooms, Part2
    • Default Setting for “Report”
    • Preferences Page "Directory" & "Cash" Tab
    • "Connection & Firmware"Tab
    • Device Hardware Setting
    • Modifying and Improving the Translation of the Vebko Amirkabir Company Website
    • Power Control and Its Relation to Heat
    • Modifying and Improving AMPro Software Translation
  • Software Home Page
    • General Types of Rooms
    • Software Start Page
  • Modules Toolbar and Statusbar
    • Toolbar and Status Bar, Part 1
    • Toolbar and Status Bar, Part 2
    • “New Based on Custom Template” Option
    • Determining Decimal Numbers, Part 1
    • Determining Decimal Numbers Part 2
    • Analog Output Setting
    • Binary Input Setting, Part1
    • Binary Input Setting, Part2
    • Binary Output’S Setting
    • Extra Setting
    • Relay Specification in Test Object
    • Introducing the “RIO”
    • Introducing “XRIO”
    • XRIO Converter File
    • XRIO Converter, Part2
    • Complementary Explanation About “XRIO Converter”
    • XRIO and XRIO Converter
    • XRIO & Relay Setting in the Software
    • XRIO Converter Formula Writing
    • Writing “XRIO Converter” for an Overcurrent Relay
    • Writing Formula for the “XRIO Converter” 3
    • Writing Formula for “XRIO Converter”4
    • Writing Formula for “XRIO Converter”5
    • Complementary Explanations of “Device” Section
  • AMT Sequencer Module
    • An Introduction to the Sequencer Room
    • “Table View” Window
    • The Separate Toolbar of “Table View” Window
    • “Detail View” Tab
    • Analog Out Tab
    • Quick Type
    • Step Ramp Type
    • Continuous Ramp Type
    • Harmonic State
    • The “Transient” State Type:
    • The “Transient” State (Observing the Impedance Trajectory)
    • The "Transient" State (Observing the Differential Trajectory)
    • “Tracking” State
    • "Set Mode and Fault Type" : Part 1
    • "Set Mode and Fault Type" : Part 2
    • Additional Settings of “Detail View”
    • "Signal View" Window Part 1
    • “Signal View” Window, Part 2
    • “Signal View” Setting, Part 1
    • “Signal View” Setting, Part 2
    • ”Vector View” Window, Part 1
    • “Vector View” Window, Part 2
    • “Vector View” Window, Part 3
    • “Measurement View” Window, Part1
    • “Level Assessment” Tab
    • “Ramp Assessment” Tab
    • “Value Assessment” Tab
    • “Calculated Assessment” Tab
    • "Transient Assessment" Tab
    • Running the Test
    • Start-Condition-Repetition" Window
    • “Report Setting” Window
    • “Report View” Window
    • Advanced Settings of “Report” Part 1
    • Advanced Settings of “Report” Part 2
    • Abilty to Convert Output Binary Voltage to Current and Vice Versa
    • Sampled Value
  • AMT Overcurrent Module
    • Introducing Over Current Room
    • Relay Settings in the "Overcurrent" Room – Part 1
    • Relay Settings in the "Overcurrent" Room – Part 2
    • Relay Settings in “Overcurrent” Room, Part 3
    • Relay Settings in the "Overcurrent" Room – Part 4
    • Test View Window
    • “Pick Up-Drop Off” Window
    • “Overcurrent” Characteristic Curve
    • “Settings” Tab of “Overcurrent” Module, Part 1
    • “Settings” Tab of “Overcurrent” Module, Part 2
    • Directional Earth Fault
    • Complementary Explanation of “Overcurrent” Room
    • Directional Overcurrent
  • AMT VI STARTING Module
    • Introducing “VI Starting” Room
    • “Shot Test” Tab
    • “Check Test” Tab
    • "VI Starting" Room Setting
  • AMT Distance Module
    • Introducing “Distance” Room, Part 1
    • Introducing “Distance” Room, Part 2
    • Introducing “Distance” Room, Part 3
    • Introducing “Testview” Window in “Distance” Room, Part 1
    • “Check Test” Tab
    • “Search Test” Tab
    • “Distance” Room Settings, Part 1
    • “Distance” Room Settings, Part 2
    • Impedance View Window
    • “Zt Diagram” and “Medium Detail View” Windows
    • Grounding Factor in Distance
    • Distance Protection Voltage and Current Calculations in the Test Room
  • AMT Differential Module
    • Relay Settings in “Differential” Room, Part 1
    • Relay Settings in “Differential” Room, Part 2
    • Introducing “Test View” Window in “Differential” Room, Part 1
    • Introducing “Test View” Window in “Differential” Room, Part 2
    • “Differential” Room Settings
    • “Differential Characteristic” Window
    • No Combined Characteristic
    • Zero Sequence Elimination
    • Restricted Earth Fault
  • AMT Diff Harmonics Module
    • Introducing “AMT Diff. Harmonics” Room
    • “Test View” Window
    • “Setting” Tab
    • “Harmonic Restraint View” Window
  • AMT Transducer Module
    • “Offload” Test Part 1
    • “Offload” Test Part 2
    • “Onload” Test of the Meter
    • Transducer Test
    • How to Use the Optical Pulse Sensor in Meter Testing
  • AMT Synchronizer Module
    • An Introduction to AMT Synchronizer
    • Test View Window in Synchronizer Room
  • AMT VCC Room
    • AMT VCC Room
  • Current Transformer Module
    • Introducing “Current Transformer (CT)” Room
    • Secondary Burden Test
    • Winding Resistance Test
    • “Excitation Test” Tab, Part 1
    • “Excitation Test” Tab, Part 2
    • CT “Excitation Test”, Part 3
    • CT Excitation Test, Part 4
    • Other Tests Performable in “Excitation Test” Tab
    • CT Ratio and Polarity Test with Current Method
    • CT Ratio and Polarity Test (with Voltage)
    • CT Test Wiring Guide Using the Instrument Module
    • CT and PT Turns Ratio
    • Estimating FS and ALF for Various CTs
  • Circuit Breaker Module
    • Introducing “Circuit Breaker(CB)” Room
    • CB “Timing Test”
    • “Contact Resistance” Tab
    • Circuit Breaker Operation Minimum Voltage Test:
    • A Guide for Performing CB Test Connections Using the Instrument Module
  • capacitor voltage transformer
    • Capacitive Voltage Transformers
    • Secondary Burden Test
    • Short-Circuit Impedance Tab
    • Winding Resistance Test
    • Excitation Tab
    • CVT Ratio2
    • Ratio Tab
    • A Guide for Cvt Test Wiring Using the Instrument Module
  • Transformer Module
    • Introducing “Transformer” Room
    • “Vector Group, Turns Ratio and No Load” Tab
    • “Magnetic Balance” Tab
    • “Winding Resistance” Tab
    • “Leakage Reactance“ Tab
    • “Demagnitize” Tab
    • Guide to Performing Transformer Test Using Instrument Module
    • Zero Sequence Elimination
    • How to Use Clamps in Transformer Testing
  • OverCurrent Quick Test Room
    • Overcurrent Quick Test Room
  • Under OverVoltage Test Room
    • Under Over Voltage Test Room
  • AMT AR Room
    • AMT Ar Room
  • Resistance Test
    • Resistance Test
  • Troubleshooting
    • The Complete Main Switching
    • Main Switching Error Overcurrent Board
    • Overcurrent Error of Board 2 Part 1
    • Overcurrent Error Board 2 Part2
    • Switching Troubleshooting
    • OC Board IGBT Test
    • Introducing the Internal Modules Part1
    • Introduceing Internal Modules Part2
    • Introducing Internal Modules Part3
    • Switching Module
    • Possible Errors in the Switching Module
    • Checking the Parts,in Switching Module Errors Part1
    • Checking the Parts,in Switching Module Errors Part2
    • Checking the Parts,in Switching Module Errors Part3
    • The Connections Between the Switching Module and the Amplifier
  • Testing of relays protection functions
    • End-to-End Test
    • Overvoltage Protection Function Test in MICOM P141 Relay
    • Undervoltage Protection Function Test in MICOM P141 Relay
    • Directional Overcurrent Protection Function Test in MICOM P141 Relay
    • Directional Earth Fault (DEF) Protection Function Test in MICOM P141 Relay
    • New End-to-End Test
    • Drawing the Distance Characteristics and Practical Example of Drawing the Quad Characteristic in Siemens 7SA522 Relay
    • Drawing the Load Encroachment Characteristic
    • Drawing the Mho Characteristic in GEC PYTC Relay
    • Synchronizer Function Test in SIPROTEC Siemens 7SD82 Relay
    • 51V Function Test in Siemens 7SD82 Relay
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Rogowski Coil Test
  • ZA
  • Goose Messaging Testing
    • GOOSE Messaging Testing
  • Trust the Software
    • Guide to Trusting Vebko(Stable-Test) Software in Bitdefender Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in Kaspersky Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in NOD32 Antivirus
  • PMU Test
    • PMU Test
  • ZE
  • Introdusing Company and Produces
    • Assembly Stages of AMR Relay
  • Software Download and Installation
    • Software Installation
  • Software Homepage and Create Project
    • Login to the Main Environment of the Software
  • Connection and Update Firmware
    • Connect with Relay
    • Firmware Relay Update
  • Relay Hardware
    • Relay Hardware Module
    • Voltage and Current Transformers Data
  • AMR Relay Test
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
  • Real Testing Requires Realistic Signals
  • AMPro Protocol Sniffer
  • Meet SV100+
  • IEC 61850 Sampled Values Testing
  • Digital substations run at the speed of light
  • Don’t Just Test Your Relays. Simulate the Grid
  • Smart Configuration Inheritance in VCC — With Full Control
  • Control What Appears in Your Test Report
  • From Comtrade to Inject
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • One State. Four Transitions. Total Control
  • Stop waiting for the test to finish
  • Balanced System, Zero Trip, Infinite Confidence
  • Defining Complex Logic For Assessments
  • Advanced Assessments
  • Vebko Around The World
  • Noise Suppression in Transformer Turns Ratio
  • Relay Data in Quick Access
  • Wiring Clarity - Without Leaving Your Workspace
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • Flexible Connectivity with AMT205 in AMPRO
  • Simultaneous Ramp on All Outputs [AMT205]
  • Continuous Ramp Capability [AMT205]
  • Distance Search Testing
  • Comprehensive Circuit Breaker Testing [AMT205]
  • Smarter Configuration In VCC File
  • New Feature In Vebko AMPro
  • Vebko Educational Videos
  • Contact Resistance Measurement
  • Test With Confidence
  • Control Your Report
  • One Device, Any Relay
  • DC Resistance Measurement
  • History of Amt105 GPS
  • History of Amt105 Wifi
  • AMT 105 Features
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    OC Board IGBT Test

    The next element that we are going to examine is the IGBT.

    It was mentioned earlier that there are four IGBTs. A diode test must be performed for the pins of these IGBTs. Every IGBT has three pins of gate, drain and source. The diode test is first performed between drain and source. If you look at the IGBT from this angle, the middle pin is drain and the right pin is source. The diode test between these pins is performed from positive to negative or from negative to positive. When the negative probe of the multimeter is placed on the drain pin and the positive side is placed on the source pin, the multimeter shows 4/8. If the probes are swapped, Overload must be displayed. The rest of the IGBTs are tested following the same procedure. In the first place, this indicates the health of the IGBT. Next, the gate pins are to be tested with drain and source which refer to the left side pin and the side pins, respectively.

    In this state, we should have the Overload value between every one of the pins. In fact, there should not be any connection between the gate and drain and source pins. If there is a short-circuit between these pins, the IGBT is definitely burned out. These IGBTs are shared two by two. If we number the IGBTs as 1, 2 , 3 and 4, then IGBT 1 and 3 and IGBT 3 and 4 are connected. When these IGBTs are damaged, if it is assumed that the first IGBT is burned out, if the third IGBT is tested it is displayed as burned out as well. This means that their pins are short-circuited. There are two cases here where one of the IGBTs is burned out and the other is being displayed as burned out. In this case, one of them is tested by being detached from the circuit. Or maybe both of them are burned out. It is the same for the second and fourth IGBTs. If they both display signs of being burned out in the diode test, one of them is detached from the circuit (how to detach an IGBT is explained in the following) and the test is performed. If this IGBT is healthy, then the other one is burned out, otherwise the other IGBT is tested as well.

    To open the IGBT, first we need to open this holder. The holder has five screws. The middle screw, the two side screws and then the other screws are unscrewed respectively and the holder is opened. Now, as an example, IGBT number one is removed from the board. To do this, we need a desoldering suction to remove the tin from the pins of the IGBT. Then we heat the pin and after the tin is completely melted, we remove it using the desoldering suction. We can do this as many times as needed for every pin until the tin is completely removed. If the tin is not completely removed, we can add some tin and then melt all of the tin on the pin and remove it again. The IGBT is removed from the board simply by giving it a shake. Now we test the IGBT outside the circuit. We repeat the pins, gain, drain and source. Between drain and source we should have 4/8 from one side, 4/8 inside the circuit and 4/5 outside the circuit. But between gate, drain and gate, the source must always have the Overload value. This IGBT here is healthy.

    To reinstall the IGBT, there is insulation beneath every IGBT just like this. In fact, this insulation prevents the MOSFET body and heat sink from touching each other. This insulation must be exactly beneath the IGBT and silicon paste is used beneath the insulation. We put the insulation beneath the IGBT like this and then put the IGBT on the heat sink and then remove its pins from the pads. But before this, first the IGBT pads must be emptied from any tin. To do this, we put some tin on the pads to melt all of the tin inside. Then we remove the tin using a desoldering suction.

    We repeat this for the next pads. Then, we remove the tin on the basses of the IGBTs. First we need to clean the tip of the soldering iron and put some flux on the pins and collect the additional tin. We repeat this for the other pins. We put the insulation talc and then install the IGBT on its extra. We put the pins of the IGBT in the pads as much as it is at the same level as the others.

    Adjust the IGBT and the talc beneath it, so there must not be any connection between the heat sync and MOSFET. After installing the IGBT, correctly fill the middle pin with tin so that the connection is established. Then we repeat this for the other pins. Another important point when replacing the IGBT is that when remove the IGBT from the board, the pads may be damaged. In fact, the metalized that is inside these pads is separated. For this, put the tin on the pin from the top so that the connection with the board is thoroughly established.

    Then close the holder. To do so, first, fasten the middle screw because a piece of metal is putting pressure on the IGBTs and the screws must be fastened in a specific order so that this pressure is uniformly applied to all of the IGBTs. This is why you don’t completely fasten the screws. Only fasten them at the end. If you are using a torque wrench for fastening the screws, set the pressure on 2.5 newtons on meter and then fasten the screw. If you are using a screwdriver, keep fastening until you feel that the screw is tight enough.

    After closing the holder, to ensure that there is no connection, put the multimeter in the ohm mode and check the middle pin of every IGBT with the body of the heat sink. It must be Overload in all states. So replacing the IGBT ends here.

     [jg1]OC_Board_IGBT_TEST

    Related topics

    • Overcurrent Error Board 2 Part2 Troubleshooting
    • Possible Errors in the Switching Module Troubleshooting
    • Checking the Parts,in Switching Module Errors Part3 Troubleshooting
    • Checking the Parts,in Switching Module Errors Part1 Troubleshooting
    • Introducing Internal Modules Part3 Troubleshooting
    • Checking the Parts,in Switching Module Errors Part2 Troubleshooting
    • The Complete Main Switching Troubleshooting
    • Switching Module Troubleshooting
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