• Language
  • VEBKO

  • Introducing the Company and Products
    • Assembling Stages of AMT105 Tester
    • Disperesing Stages of AMT Tester
    • Introducing the Device and Equipment
    • Comparative Analysis of AMT105, AMT205, AMT103, and AMT203 Devices
    • AMPro Software Translation
  • Software Installation and Connection Setting
    • Software Installation
    • How to Connect to AMT
    • Simultaneous Connection of Several Testers
    • Resetting IP Address
    • Updating Firmware of Device Manually
  • Default Setting
    • General Setting of Rooms
    • General Setting of Rooms, Part2
    • Default Setting for “Report”
    • Preferences Page "Directory" & "Cash" Tab
    • "Connection & Firmware"Tab
    • Device Hardware Setting
    • Modifying and Improving the Translation of the Vebko Amirkabir Company Website
    • Power Control and Its Relation to Heat
    • Modifying and Improving AMPro Software Translation
  • Software Home Page
    • General Types of Rooms
    • Software Start Page
  • Modules Toolbar and Statusbar
    • Toolbar and Status Bar, Part 1
    • Toolbar and Status Bar, Part 2
    • “New Based on Custom Template” Option
    • Determining Decimal Numbers, Part 1
    • Determining Decimal Numbers Part 2
    • Analog Output Setting
    • Binary Input Setting, Part1
    • Binary Input Setting, Part2
    • Binary Output’S Setting
    • Extra Setting
    • Relay Specification in Test Object
    • Introducing the “RIO”
    • Introducing “XRIO”
    • XRIO Converter File
    • XRIO Converter, Part2
    • Complementary Explanation About “XRIO Converter”
    • XRIO and XRIO Converter
    • XRIO & Relay Setting in the Software
    • XRIO Converter Formula Writing
    • Writing “XRIO Converter” for an Overcurrent Relay
    • Writing Formula for the “XRIO Converter” 3
    • Writing Formula for “XRIO Converter”4
    • Writing Formula for “XRIO Converter”5
    • Complementary Explanations of “Device” Section
  • AMT Sequencer Module
    • An Introduction to the Sequencer Room
    • “Table View” Window
    • The Separate Toolbar of “Table View” Window
    • “Detail View” Tab
    • Analog Out Tab
    • Quick Type
    • Step Ramp Type
    • Continuous Ramp Type
    • Harmonic State
    • The “Transient” State Type:
    • The “Transient” State (Observing the Impedance Trajectory)
    • The "Transient" State (Observing the Differential Trajectory)
    • “Tracking” State
    • "Set Mode and Fault Type" : Part 1
    • "Set Mode and Fault Type" : Part 2
    • Additional Settings of “Detail View”
    • "Signal View" Window Part 1
    • “Signal View” Window, Part 2
    • “Signal View” Setting, Part 1
    • “Signal View” Setting, Part 2
    • ”Vector View” Window, Part 1
    • “Vector View” Window, Part 2
    • “Vector View” Window, Part 3
    • “Measurement View” Window, Part1
    • “Level Assessment” Tab
    • “Ramp Assessment” Tab
    • “Value Assessment” Tab
    • “Calculated Assessment” Tab
    • "Transient Assessment" Tab
    • Running the Test
    • Start-Condition-Repetition" Window
    • “Report Setting” Window
    • “Report View” Window
    • Advanced Settings of “Report” Part 1
    • Advanced Settings of “Report” Part 2
    • Abilty to Convert Output Binary Voltage to Current and Vice Versa
    • Sampled Value
  • AMT Overcurrent Module
    • Introducing Over Current Room
    • Relay Settings in the "Overcurrent" Room – Part 1
    • Relay Settings in the "Overcurrent" Room – Part 2
    • Relay Settings in “Overcurrent” Room, Part 3
    • Relay Settings in the "Overcurrent" Room – Part 4
    • Test View Window
    • “Pick Up-Drop Off” Window
    • “Overcurrent” Characteristic Curve
    • “Settings” Tab of “Overcurrent” Module, Part 1
    • “Settings” Tab of “Overcurrent” Module, Part 2
    • Directional Earth Fault
    • Complementary Explanation of “Overcurrent” Room
    • Directional Overcurrent
  • AMT VI STARTING Module
    • Introducing “VI Starting” Room
    • “Shot Test” Tab
    • “Check Test” Tab
    • "VI Starting" Room Setting
  • AMT Distance Module
    • Introducing “Distance” Room, Part 1
    • Introducing “Distance” Room, Part 2
    • Introducing “Distance” Room, Part 3
    • Introducing “Testview” Window in “Distance” Room, Part 1
    • “Check Test” Tab
    • “Search Test” Tab
    • “Distance” Room Settings, Part 1
    • “Distance” Room Settings, Part 2
    • Impedance View Window
    • “Zt Diagram” and “Medium Detail View” Windows
    • Grounding Factor in Distance
    • Distance Protection Voltage and Current Calculations in the Test Room
  • AMT Differential Module
    • Relay Settings in “Differential” Room, Part 1
    • Relay Settings in “Differential” Room, Part 2
    • Introducing “Test View” Window in “Differential” Room, Part 1
    • Introducing “Test View” Window in “Differential” Room, Part 2
    • “Differential” Room Settings
    • “Differential Characteristic” Window
    • No Combined Characteristic
    • Zero Sequence Elimination
    • Restricted Earth Fault
  • AMT Diff Harmonics Module
    • Introducing “AMT Diff. Harmonics” Room
    • “Test View” Window
    • “Setting” Tab
    • “Harmonic Restraint View” Window
  • AMT Transducer Module
    • “Offload” Test Part 1
    • “Offload” Test Part 2
    • “Onload” Test of the Meter
    • Transducer Test
    • How to Use the Optical Pulse Sensor in Meter Testing
  • AMT Synchronizer Module
    • An Introduction to AMT Synchronizer
    • Test View Window in Synchronizer Room
  • AMT VCC Room
    • AMT VCC Room
  • Current Transformer Module
    • Introducing “Current Transformer (CT)” Room
    • Secondary Burden Test
    • Winding Resistance Test
    • “Excitation Test” Tab, Part 1
    • “Excitation Test” Tab, Part 2
    • CT “Excitation Test”, Part 3
    • CT Excitation Test, Part 4
    • Other Tests Performable in “Excitation Test” Tab
    • CT Ratio and Polarity Test with Current Method
    • CT Ratio and Polarity Test (with Voltage)
    • CT Test Wiring Guide Using the Instrument Module
    • CT and PT Turns Ratio
    • Estimating FS and ALF for Various CTs
  • Circuit Breaker Module
    • Introducing “Circuit Breaker(CB)” Room
    • CB “Timing Test”
    • “Contact Resistance” Tab
    • Circuit Breaker Operation Minimum Voltage Test:
    • A Guide for Performing CB Test Connections Using the Instrument Module
  • capacitor voltage transformer
    • Capacitive Voltage Transformers
    • Secondary Burden Test
    • Short-Circuit Impedance Tab
    • Winding Resistance Test
    • Excitation Tab
    • CVT Ratio2
    • Ratio Tab
    • A Guide for Cvt Test Wiring Using the Instrument Module
  • Transformer Module
    • Introducing “Transformer” Room
    • “Vector Group, Turns Ratio and No Load” Tab
    • “Magnetic Balance” Tab
    • “Winding Resistance” Tab
    • “Leakage Reactance“ Tab
    • “Demagnitize” Tab
    • Guide to Performing Transformer Test Using Instrument Module
    • Zero Sequence Elimination
    • How to Use Clamps in Transformer Testing
  • OverCurrent Quick Test Room
    • Overcurrent Quick Test Room
  • Under OverVoltage Test Room
    • Under Over Voltage Test Room
  • AMT AR Room
    • AMT Ar Room
  • Resistance Test
    • Resistance Test
  • Troubleshooting
    • The Complete Main Switching
    • Main Switching Error Overcurrent Board
    • Overcurrent Error of Board 2 Part 1
    • Overcurrent Error Board 2 Part2
    • Switching Troubleshooting
    • OC Board IGBT Test
    • Introducing the Internal Modules Part1
    • Introduceing Internal Modules Part2
    • Introducing Internal Modules Part3
    • Switching Module
    • Possible Errors in the Switching Module
    • Checking the Parts,in Switching Module Errors Part1
    • Checking the Parts,in Switching Module Errors Part2
    • Checking the Parts,in Switching Module Errors Part3
    • The Connections Between the Switching Module and the Amplifier
  • Testing of relays protection functions
    • End-to-End Test
    • Overvoltage Protection Function Test in MICOM P141 Relay
    • Undervoltage Protection Function Test in MICOM P141 Relay
    • Directional Overcurrent Protection Function Test in MICOM P141 Relay
    • Directional Earth Fault (DEF) Protection Function Test in MICOM P141 Relay
    • New End-to-End Test
    • Drawing the Distance Characteristics and Practical Example of Drawing the Quad Characteristic in Siemens 7SA522 Relay
    • Drawing the Load Encroachment Characteristic
    • Drawing the Mho Characteristic in GEC PYTC Relay
    • Synchronizer Function Test in SIPROTEC Siemens 7SD82 Relay
    • 51V Function Test in Siemens 7SD82 Relay
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Rogowski Coil Test
  • ZA
  • Goose Messaging Testing
    • GOOSE Messaging Testing
  • Trust the Software
    • Guide to Trusting Vebko(Stable-Test) Software in Bitdefender Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in Kaspersky Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in NOD32 Antivirus
  • PMU Test
    • PMU Test
  • ZE
  • Introdusing Company and Produces
    • Assembly Stages of AMR Relay
  • Software Download and Installation
    • Software Installation
  • Software Homepage and Create Project
    • Login to the Main Environment of the Software
  • Connection and Update Firmware
    • Connect with Relay
    • Firmware Relay Update
  • Relay Hardware
    • Relay Hardware Module
    • Voltage and Current Transformers Data
  • AMR Relay Test
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
  • Real Testing Requires Realistic Signals
  • AMPro Protocol Sniffer
  • Meet SV100+
  • IEC 61850 Sampled Values Testing
  • Digital substations run at the speed of light
  • Don’t Just Test Your Relays. Simulate the Grid
  • Smart Configuration Inheritance in VCC — With Full Control
  • Control What Appears in Your Test Report
  • From Comtrade to Inject
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • One State. Four Transitions. Total Control
  • Stop waiting for the test to finish
  • Balanced System, Zero Trip, Infinite Confidence
  • Defining Complex Logic For Assessments
  • Advanced Assessments
  • Vebko Around The World
  • Noise Suppression in Transformer Turns Ratio
  • Relay Data in Quick Access
  • Wiring Clarity - Without Leaving Your Workspace
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • Flexible Connectivity with AMT205 in AMPRO
  • Simultaneous Ramp on All Outputs [AMT205]
  • Continuous Ramp Capability [AMT205]
  • Distance Search Testing
  • Comprehensive Circuit Breaker Testing [AMT205]
  • Smarter Configuration In VCC File
  • New Feature In Vebko AMPro
  • Vebko Educational Videos
  • Contact Resistance Measurement
  • Test With Confidence
  • Control Your Report
  • One Device, Any Relay
  • DC Resistance Measurement
  • History of Amt105 GPS
  • History of Amt105 Wifi
  • AMT 105 Features
  • Catalog
    • Catalog All
    • Accessories
    • Agencies
    • Catalog
    • Hardware
  • PDF Download PDF
    0 / 0

    AMT Ar Room

    Various studies have shown that around 70 to 90 percent of the faults in overhead power lines are transient. At lower-level voltages such as distribution, there are fewer and about 80 percent transient faults while in higher-level voltages such as transmission, this value is about 90 percent.

    Thunder is one of the most common reasons for a fault to occur. The swinging of the wires or short-circuit of the grid with sundry objects is another cause for the occurrence of transient faults. Most faults can be solved by correctly using the trip process or reconnection so that the grid disconnection time reaches a minimum. To test any type of reclosers, its exclusive room which is AMT AR can be used.

    The main window of this room is Instrument AR. Also, it is possible to access other windows from the View menu or the bar on the right side of this page. To begin the test, first, the user needs to insert the functions that need the reconnection process to be examined for them into the Data Table. Therefore, it is possible to examine and assess the action or inaction of the AR for different functions. .

    By clicking on “Add Cycle”, the next rows are added so that the reconnection is examined after the selected functions.

    After selecting the title of the function, the user only needs to enter the performance characteristic and its settings for the delay and instantaneous units. After that, the amount of the injected current and the fault angle are entered so that the time duration for different states is determined in accordance with the selected Curve.

    Dead Time and Reclaim Time are two other options that are used to speed up making the states.

    Finally, in the Expected section, the user needs to specify their expectation from the success or failure of the recloser after the action of the specified function.

    In the next step, the user needs to specify the necessary Binary Inputs and Binary Outputs in accordance with the elements required for the recloser test. It should be noted that for the convenience of the users, the important signals are available in the drop-down list by default.

    In this section, by selecting Add Row and Delete Row options, it is possible to add a row to add the binaries and delete the selected row, respectively.

    Considering the two types of the reclose test including laboratory testing (simulation of the binary of the outputs by the test device and receiving the binaries by the device) and testing in power stations (receiving binary of the inputs by the device and presence of the binary outputs through the wiring post), some of the titles are common between the two lists of inputs and outputs.

    After selecting the number of the binary input and signal, it is possible to specify its influence on the current states including PreFault, Fault, Deadtime and Reclaim time. In other words, the condition for ending every state is determined by the binary inputs.

    In the next step, after selecting the number of the binary output and its signal, the user only needs to specify its condition for every state. This is most useful in cases where, for example, signals such as CB Ready or Close and Open are needed and testing the relay in the laboratory is intended.

    After adjusting the settings, by clicking on Init Test option, the states are created. These states can be viewed from Table View section. Also, it is possible to compare the different settings and elements of every state with more details in Detail View section.

    In this video, the AR function test for the MiCOM P139 relay is going to be performed. In this test, the recloser function is activated after the occurrence of the earth fault. To begin, the user needs to go to the settings section of the relay and set the parameters related to the functions. Here, in the subcategory number one of parameters, function DTOC is assigned to SEF protection..

    In IDMT1 section, the protections of OC and EF are of the delay type while in IDMT2 section, the protections of OC and EF are set at the instantaneous type..

    Now, by going to the ARC section, the settings related to the auto-recloser are adjusted. Here, the TDR option refers to recloser with time delay; Dead Time and Reclaim Time are set at 4 and 20 seconds, respectively, but it is also possible to activate the HSR which is the high-speed recloser..

    Next, the outputs are configured. Moreover, in INP section, the inputs needed for the assessment and the test are configured. By referring to the relay manual, it is possible to view an outline of the behavior of the P131 recloser function.

    In certain situations such as cases where there is a manual close, external signal, ARC function deactivation, and manual trip and protection deactivation, the recloser will be blocked. It is possible for the user to examine these signals in the AR room of the AMPro software. The user can begin the test after ensuring that the necessary conditions for the recloser to perform are met; these conditions include activating the protection, not blocking the ARC function, and being able to open and close the breaker and have the close state of the key. To adjust the relay wiring, the user can use the connection diagram from the manual.

    The user needs to go to the AMT AR room one more time and add the two functions of earth fault and overcurrent. It should be noted that in the first step, reconnection is tested for the earth fault function. This step must be passed successfully and receiving the close signal or the connection needs to happen as well. After specifying the settings related to this function in the first row, single-phase fault to earth is selected and Dead Time and Reclaim Time values are entered.

    Also, in the Expected section, the expectation from the act of reconnection is set at successful. In the next row, OC function is added. Similarly, the settings related to the delay and instantaneous stages as well as the fault current value, fault type, Deadtime value and Reclaim Time value are entered. In this section, we expect the act of reconnection to be unsuccessful..

    Now it is time to configure the input binaries. In this section, connection trip and pulse are selected from the list in this exact order.  Here, trip is selected as the finisher element for the Fault state. It is also possible to select Close Pulse or Reclosure Successful as the finisher element for the Deadtime state. This should be noted that the “PreFault” state time is automatically longer than the “Reset Time” or “Reclaim Time”. 

    In the binary outputs section, three signals of CB Close, CB Open and CB Healthy or AR Ready are added. Here it is possible to specify the status of every signal for different states ranging from “PreFault” to “Fault”, Dead Time”, and “Reclaim Time”.

    Finally, the “States” are created by clicking on “Init Test” option. The user can view the created states by opening the Table View window.

    After creating the states, it is possible to adjust the necessary settings for the assessment in the “Assessment” section. Also, after performing the test, it is possible to assess the performance of the recloser for these two functions. In the end, by clicking on “Add to Report” option, the test result is added to the created report. View window.

     [jg1]AMT_AR_Room

    Related topics

    • Additional Settings of “Detail View” AMT Sequencer Module
    • Winding Resistance Test capacitor voltage transformer
    • An Introduction to the Sequencer Room AMT Sequencer Module
    • Under Over Voltage Test Room Under OverVoltage Test Room
    • Transducer Test AMT Transducer Module
    • “Onload” Test of the Meter AMT Transducer Module
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates) AMR Relay Test
    • AMT VCC Room AMT VCC Room
    Sharing Window
    Telegram Telegram WhatsApp WhatsApp Eitaa Eitaa FaceBook FaceBook Linkedin Linkedin X X
    AMT Ar Room
    Tap play once on mobile if autoplay is blocked.
    En Fa De Tr Mu
    MP4
    MP3
    SRT
    DOC