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  • VEBKO

  • Introducing the Company and Products
    • Assembling Stages of AMT105 Tester
    • Disperesing Stages of AMT Tester
    • Introducing the Device and Equipment
    • Comparative Analysis of AMT105, AMT205, AMT103, and AMT203 Devices
    • AMPro Software Translation
  • Software Installation and Connection Setting
    • Software Installation
    • How to Connect to AMT
    • Simultaneous Connection of Several Testers
    • Resetting IP Address
    • Updating Firmware of Device Manually
  • Default Setting
    • General Setting of Rooms
    • General Setting of Rooms, Part2
    • Default Setting for “Report”
    • Preferences Page "Directory" & "Cash" Tab
    • "Connection & Firmware"Tab
    • Device Hardware Setting
    • Modifying and Improving the Translation of the Vebko Amirkabir Company Website
    • Power Control and Its Relation to Heat
    • Modifying and Improving AMPro Software Translation
  • Software Home Page
    • General Types of Rooms
    • Software Start Page
  • Modules Toolbar and Statusbar
    • Toolbar and Status Bar, Part 1
    • Toolbar and Status Bar, Part 2
    • “New Based on Custom Template” Option
    • Determining Decimal Numbers, Part 1
    • Determining Decimal Numbers Part 2
    • Analog Output Setting
    • Binary Input Setting, Part1
    • Binary Input Setting, Part2
    • Binary Output’S Setting
    • Extra Setting
    • Relay Specification in Test Object
    • Introducing the “RIO”
    • Introducing “XRIO”
    • XRIO Converter File
    • XRIO Converter, Part2
    • Complementary Explanation About “XRIO Converter”
    • XRIO and XRIO Converter
    • XRIO & Relay Setting in the Software
    • XRIO Converter Formula Writing
    • Writing “XRIO Converter” for an Overcurrent Relay
    • Writing Formula for the “XRIO Converter” 3
    • Writing Formula for “XRIO Converter”4
    • Writing Formula for “XRIO Converter”5
    • Complementary Explanations of “Device” Section
  • AMT Sequencer Module
    • An Introduction to the Sequencer Room
    • “Table View” Window
    • The Separate Toolbar of “Table View” Window
    • “Detail View” Tab
    • Analog Out Tab
    • Quick Type
    • Step Ramp Type
    • Continuous Ramp Type
    • Harmonic State
    • The “Transient” State Type:
    • The “Transient” State (Observing the Impedance Trajectory)
    • The "Transient" State (Observing the Differential Trajectory)
    • “Tracking” State
    • "Set Mode and Fault Type" : Part 1
    • "Set Mode and Fault Type" : Part 2
    • Additional Settings of “Detail View”
    • "Signal View" Window Part 1
    • “Signal View” Window, Part 2
    • “Signal View” Setting, Part 1
    • “Signal View” Setting, Part 2
    • ”Vector View” Window, Part 1
    • “Vector View” Window, Part 2
    • “Vector View” Window, Part 3
    • “Measurement View” Window, Part1
    • “Level Assessment” Tab
    • “Ramp Assessment” Tab
    • “Value Assessment” Tab
    • “Calculated Assessment” Tab
    • "Transient Assessment" Tab
    • Running the Test
    • Start-Condition-Repetition" Window
    • “Report Setting” Window
    • “Report View” Window
    • Advanced Settings of “Report” Part 1
    • Advanced Settings of “Report” Part 2
    • Abilty to Convert Output Binary Voltage to Current and Vice Versa
    • Sampled Value
  • AMT Overcurrent Module
    • Introducing Over Current Room
    • Relay Settings in the "Overcurrent" Room – Part 1
    • Relay Settings in the "Overcurrent" Room – Part 2
    • Relay Settings in “Overcurrent” Room, Part 3
    • Relay Settings in the "Overcurrent" Room – Part 4
    • Test View Window
    • “Pick Up-Drop Off” Window
    • “Overcurrent” Characteristic Curve
    • “Settings” Tab of “Overcurrent” Module, Part 1
    • “Settings” Tab of “Overcurrent” Module, Part 2
    • Directional Earth Fault
    • Complementary Explanation of “Overcurrent” Room
    • Directional Overcurrent
  • AMT VI STARTING Module
    • Introducing “VI Starting” Room
    • “Shot Test” Tab
    • “Check Test” Tab
    • "VI Starting" Room Setting
  • AMT Distance Module
    • Introducing “Distance” Room, Part 1
    • Introducing “Distance” Room, Part 2
    • Introducing “Distance” Room, Part 3
    • Introducing “Testview” Window in “Distance” Room, Part 1
    • “Check Test” Tab
    • “Search Test” Tab
    • “Distance” Room Settings, Part 1
    • “Distance” Room Settings, Part 2
    • Impedance View Window
    • “Zt Diagram” and “Medium Detail View” Windows
    • Grounding Factor in Distance
    • Distance Protection Voltage and Current Calculations in the Test Room
  • AMT Differential Module
    • Relay Settings in “Differential” Room, Part 1
    • Relay Settings in “Differential” Room, Part 2
    • Introducing “Test View” Window in “Differential” Room, Part 1
    • Introducing “Test View” Window in “Differential” Room, Part 2
    • “Differential” Room Settings
    • “Differential Characteristic” Window
    • No Combined Characteristic
    • Zero Sequence Elimination
    • Restricted Earth Fault
  • AMT Diff Harmonics Module
    • Introducing “AMT Diff. Harmonics” Room
    • “Test View” Window
    • “Setting” Tab
    • “Harmonic Restraint View” Window
  • AMT Transducer Module
    • “Offload” Test Part 1
    • “Offload” Test Part 2
    • “Onload” Test of the Meter
    • Transducer Test
    • How to Use the Optical Pulse Sensor in Meter Testing
  • AMT Synchronizer Module
    • An Introduction to AMT Synchronizer
    • Test View Window in Synchronizer Room
  • AMT VCC Room
    • AMT VCC Room
  • Current Transformer Module
    • Introducing “Current Transformer (CT)” Room
    • Secondary Burden Test
    • Winding Resistance Test
    • “Excitation Test” Tab, Part 1
    • “Excitation Test” Tab, Part 2
    • CT “Excitation Test”, Part 3
    • CT Excitation Test, Part 4
    • Other Tests Performable in “Excitation Test” Tab
    • CT Ratio and Polarity Test with Current Method
    • CT Ratio and Polarity Test (with Voltage)
    • CT Test Wiring Guide Using the Instrument Module
    • CT and PT Turns Ratio
    • Estimating FS and ALF for Various CTs
  • Circuit Breaker Module
    • Introducing “Circuit Breaker(CB)” Room
    • CB “Timing Test”
    • “Contact Resistance” Tab
    • Circuit Breaker Operation Minimum Voltage Test:
    • A Guide for Performing CB Test Connections Using the Instrument Module
  • capacitor voltage transformer
    • Capacitive Voltage Transformers
    • Secondary Burden Test
    • Short-Circuit Impedance Tab
    • Winding Resistance Test
    • Excitation Tab
    • CVT Ratio2
    • Ratio Tab
    • A Guide for Cvt Test Wiring Using the Instrument Module
  • Transformer Module
    • Introducing “Transformer” Room
    • “Vector Group, Turns Ratio and No Load” Tab
    • “Magnetic Balance” Tab
    • “Winding Resistance” Tab
    • “Leakage Reactance“ Tab
    • “Demagnitize” Tab
    • Guide to Performing Transformer Test Using Instrument Module
    • Zero Sequence Elimination
    • How to Use Clamps in Transformer Testing
  • OverCurrent Quick Test Room
    • Overcurrent Quick Test Room
  • Under OverVoltage Test Room
    • Under Over Voltage Test Room
  • AMT AR Room
    • AMT Ar Room
  • Resistance Test
    • Resistance Test
  • Troubleshooting
    • The Complete Main Switching
    • Main Switching Error Overcurrent Board
    • Overcurrent Error of Board 2 Part 1
    • Overcurrent Error Board 2 Part2
    • Switching Troubleshooting
    • OC Board IGBT Test
    • Introducing the Internal Modules Part1
    • Introduceing Internal Modules Part2
    • Introducing Internal Modules Part3
    • Switching Module
    • Possible Errors in the Switching Module
    • Checking the Parts,in Switching Module Errors Part1
    • Checking the Parts,in Switching Module Errors Part2
    • Checking the Parts,in Switching Module Errors Part3
    • The Connections Between the Switching Module and the Amplifier
  • Testing of relays protection functions
    • End-to-End Test
    • Overvoltage Protection Function Test in MICOM P141 Relay
    • Undervoltage Protection Function Test in MICOM P141 Relay
    • Directional Overcurrent Protection Function Test in MICOM P141 Relay
    • Directional Earth Fault (DEF) Protection Function Test in MICOM P141 Relay
    • New End-to-End Test
    • Drawing the Distance Characteristics and Practical Example of Drawing the Quad Characteristic in Siemens 7SA522 Relay
    • Drawing the Load Encroachment Characteristic
    • Drawing the Mho Characteristic in GEC PYTC Relay
    • Synchronizer Function Test in SIPROTEC Siemens 7SD82 Relay
    • 51V Function Test in Siemens 7SD82 Relay
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Rogowski Coil Test
  • ZA
  • Goose Messaging Testing
    • GOOSE Messaging Testing
  • Trust the Software
    • Guide to Trusting Vebko(Stable-Test) Software in Bitdefender Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in Kaspersky Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in NOD32 Antivirus
  • PMU Test
    • PMU Test
  • ZE
  • Introdusing Company and Produces
    • Assembly Stages of AMR Relay
  • Software Download and Installation
    • Software Installation
  • Software Homepage and Create Project
    • Login to the Main Environment of the Software
  • Connection and Update Firmware
    • Connect with Relay
    • Firmware Relay Update
  • Relay Hardware
    • Relay Hardware Module
    • Voltage and Current Transformers Data
  • AMR Relay Test
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
  • Real Testing Requires Realistic Signals
  • AMPro Protocol Sniffer
  • Meet SV100+
  • IEC 61850 Sampled Values Testing
  • Digital substations run at the speed of light
  • Don’t Just Test Your Relays. Simulate the Grid
  • Smart Configuration Inheritance in VCC — With Full Control
  • Control What Appears in Your Test Report
  • From Comtrade to Inject
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • One State. Four Transitions. Total Control
  • Stop waiting for the test to finish
  • Balanced System, Zero Trip, Infinite Confidence
  • Defining Complex Logic For Assessments
  • Advanced Assessments
  • Vebko Around The World
  • Noise Suppression in Transformer Turns Ratio
  • Relay Data in Quick Access
  • Wiring Clarity - Without Leaving Your Workspace
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • Flexible Connectivity with AMT205 in AMPRO
  • Simultaneous Ramp on All Outputs [AMT205]
  • Continuous Ramp Capability [AMT205]
  • Distance Search Testing
  • Comprehensive Circuit Breaker Testing [AMT205]
  • Smarter Configuration In VCC File
  • New Feature In Vebko AMPro
  • Vebko Educational Videos
  • Contact Resistance Measurement
  • Test With Confidence
  • Control Your Report
  • One Device, Any Relay
  • DC Resistance Measurement
  • History of Amt105 GPS
  • History of Amt105 Wifi
  • AMT 105 Features
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    Quick Type

    because “State Type: Quick” is very useful, for this “State Type”, there is a “Layout” named “Default Layout for Quick”  designed for this “State Type” in “Window” menu. In this “Layout”, “Detail View”, “Signal View”, “Impedance View” and “Vector View” windows are located by default.

    To describe this “State Type” and to view the outputs, it is better to maximize only “Detail View” and “Signal View” windows. In this “State Type” it is possible to, either manually or automatically, adjust the voltage and current signal output of the device in form of an increasing or decreasing ramp. In this “State Type” the user can create an increasing or decreasing ramp not only on the amplitude of signals but also on phase and frequency values. In “Analog Out” tab in “State Type” section, “Quick” is selected from the slide bar and in the “State Name” field, a name is selected for the intended “State”.

    Description about “State Type: Quick” is provided in “General: Direct “mode. In this mode, the voltage and current signals are initialized directly. To create an increasing or decreasing ramp on outputs of the device, information of “Analog Output Channels” and “Step Values” tables should be completed.

    “Analog Output Channels” table

    In this table the start value of signals is entered which indicates the start point of the ramp. This start value can be entered for all three parameters amplitude, phase and frequency of current or voltage. It should be noted that it is possible to use ramp on both voltage and current signals simultaneously. For example, the start values of voltage signals are “10”, “15”, and “20” volts and “2”, “3” and “4” amps for current signals. Other information related to “Analog Output Channels” has been described before.

    “Step Values” table

    In this table, the value of “Step” to increase or decrease signals is entered. In this table it is possible to enter the “Step” value for all three parameters amplitude, phase and frequency. This means that it is possible to increase or decrease all these parameters simultaneously with different or the same amplitudes. At the top of this table, by checking “Simple mode (L1-L2-L3)”, you will have the same steps for all three voltage or current phases. After checking this option in “Voltage” and “Current” sections, the parameter on which we wish to create a ramp is selected from the slide bar in the “Ramp on” section. Then, the “Step” value is entered in “Step Value” field.

    After unchecking “Simple mode(L1-L2-L3)”, in “Step Values” table, “1”, “2” and “3” volts are entered for voltage signals as ramp values while for current signals, “0.1”, “0.2” and “0.3” amps are entered as ramp values.  

    By checking “Enable mouse wheel” option, if the cursor is on “Step Values” table, by using the mouse wheel, it is possible to increase or decrease the signal values and the specified steps simultaneously. This can be during or even before running the test. It should be noted that these changes are only possible if the ramp is set on “Manual” mode.

    “Quick Setting” section

    In this section by checking “Show Time from final step”, the time from the final step is displayed. One of the uses for this is in measuring the trip time of the relay. By checking “Clear Test after Start Edit” after running the test, if any changes are made to the test, without using the Clear test option, Information and setting can be altered.

    By checking the "Enable mouse wheel everywhere" option and holding the mouse pointer over the "Detail View" window, the values of the signals will increase or decrease with the specified steps if the mouse roller is rotated. If the mouse roller is turned upwards, the ramp will be incremental, and if it is rotated downwards, the ramp will be decreasing. This option is also used when the ramp is changed manually. If you also check the "Enable mouse wheel on step Table" option, the output values will change only by turning the mouse roller if the mouse pointer is on the "Step Values" table.

    By checking “Show Only Final Trip” option, the trip time is displayed by binary inputs of the last step. In “Time Out” field, the injection time of “State” is specified which is by default in set on “999” seconds in “Quick” mode. In “Quick” mode, the ramp is created either automatically or manually. After running the test if the “Manual” option is selected, the ramp is created manually and by clicking on “˄” and “˅” it is possible to create increasing or decreasing ramp.

    If during the test “Auto” option is selected, ramp is created automatically. In "∆t" field the time of each step is specified. By selecting “Up”, the ramp increases automatically and by selecting “Down” it decreases automatically. In “Enable Reset” field, it is possible to specify the reset time of signal value in a way that after checking this option during the test, the signal value is “Reset” for the specified period of time which is determined in “Reset” in “Reset Values” table.

    In this “State Type” it is possible to add information and results of the test to the output report by clicking on “Add to report” option. After clicking on this option, by opening the “State and Comment of Report” page, the settings related to the output report are adjusted. In the “Title” field, a title is entered for the output report and in “Show in Report” section from the “Quick” tree diagram, it is specified that what information are to be included in the output report. In “Comment” section, it is possible to add an additional comment or explanation for the report. In “Custom Image” section, you can add an image to the report. In this report, it is the user who determines whether the test was successful or not by clicking on “Passed” option for success and “Failed” option for failure of the test. Then, the result is included in the report which can be viewed in the “Report View” window.

    By clicking on “Edit.Delete.Report” option, the “Delete from Report” window opens where it is possible to edit or delete the added reports. It is done by selecting the intended report and clicking on “Edit Selected Report” to edit the report and then clicking on “Passed” or “Fail”. It is, also, possible to delete a report by clicking on “Delete Selected Report”. In the row of every report there are columns like “Trip Time”, “Detail View”, etc. which are added to the report if “True” is selected as their value but “False” is selected, they are removed from the output report.

    By clicking on “Swap” at the top of the page, “Quick Setting” and “Ramp Termination” sections are swapped. This is done, according to the user's need, to show the "Ramp Termination" section. In “Ramp Termination” section, the conditions for terminating the “Ramp” are specified. The difference between this section and “State Termination” is that here the signal injection is continued and only step change of signals is terminated but in “State Termination” after the condition is met, the “State” is terminated. The termination conditions of “Ramp” are just like “Trigger Setting” which has been described in previous videos.

    By selecting “Reset Value”, it is possible to adjust the “Reset” value for voltage and current signals in “Reset Values” table so if “Apply Reset” is selected during the test, the values of voltage and current signals change to the specified “Reset” values. This feature is useful in tests like “Minimum Voltage to Operate Circuit breaker. By clicking on “Apply Zero”, the values of voltage and current signals are changed to zero. By clicking on “Hold Value”, the values of voltage and current signals remain as they are and do not change.

    The information related to "Trigger Setting" has been described in previous videos. By selecting "Offset Value", it is possible to give an offset to the signal in the "Offset Value" table. For example it is possible to give a value of "DC=10" volts to "VLE-1" signal or even give a value of decaying "DC" to the initial voltage. It is also possible to add a harmonic offset to the initial signal by changing the frequency. After repeating the test, all changes made along with their time are displayed in “Changes” section. “Disable Relay” section has been described in previous videos.

     [jg1]Quick_Type

    Related topics

    • Step Ramp Type AMT Sequencer Module
    • Continuous Ramp Type AMT Sequencer Module
    • "Set Mode and Fault Type" : Part 1 AMT Sequencer Module
    • Additional Settings of “Detail View” AMT Sequencer Module
    • “Vector View” Window, Part 3 AMT Sequencer Module
    • “Ramp Assessment” Tab AMT Sequencer Module
    • “Table View” Window AMT Sequencer Module
    • The “Transient” State Type: AMT Sequencer Module
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