“Level Assessment” Tab

One of the tool for evaluating the binary inputs that should be preserved during the test is “level assessment”. In “level assessment” tab, the binary situation of the device inputs can be assessed at the start of a “state”. An example is provided for this process.

First three “states” are created in the window “table view”. Then, the range of voltage signals are inserted as “30” v in “state1”. The value of “4” seconds is inserted in the “trigger” field. Then, the value of “10” v is inserted in “state2” and its time is set as “3” second. The value of “30” v is inserted in “state3” and its time is set as “4” seconds.

In the following, by clicking “hardware configuration” in the tab “analog out”, current signals become deactivated. The binary inputs 3 and 4 can be activated in the tab “binary/analog input” in “binary-input target”; then, they are assigned a name. Here, the type of binary inputs is set as “dry”.

Then in the window “measurement view”, click on the tab “level assessment”. In this tab by clicking “state name”, the names of the existing “states” are inserted in “table view”. This name is uneditable. Note that in this tab, you cannot add a line manually. In the “level assessment” tab, the right click tool is deactivated, and for every “state” in the window “table view”, a line has been created in this tab. So, the number of assessments in this section depends on the number of “states” existing in the “table view” window.

The result of assessment is presented in the “assessment” column. The value of time tolerance for assessment of the zero or one level of the binary input is entered into the column “tolerance”. It can be simply stated that assessment of the level of each signal at the right and left sides of the starting point of each state depends on the value of time tolerance specified in this part. Suppose that the value of 30 ms is inserted as the tolerance of a binary input, the figure presents the schematic level assessment of the signal of this binary input. As it is obvious, level assessment at the two sides of state2 is done by a time tolerance of 30 ms in order to check the condition specified for this assessment; for example the level of the binary input should be equal to 1. As assumed, if the considered condition is that the level of Trip signal should be equal to 1 for state2, the result of assessment will be passed.

In the “level assessment” tab, the number of binaries defined in “hardware configuration”, column is added with the same name. In this part, you can set the level one or zero regardless of the binary level condition that is X.

In this film, the goal is the assessment of the level one of the binary 3 (Trip) in “state2”. Suppose that the level of binary 3 before and after the second “state” is equal to one for “40” ms and assessment result is pass. For this purpose, the value of “40” ms is inserted in “state2” in the field “tolerance”, and the level one is inserted in the field “Trip” (binary 3). A comment about the assessment can be inserted in “user comment” that is also used in the output report. Then run the test. After the test, assessment is done and the result is presented in “assessment”. As seen in “signal view”, before and after the “state2”, binary one has been preserved for at least “40” ms. So, the result of assessment is “pass”.