• Language
  • VEBKO

  • Introducing the Company and Products
    • Assembling Stages of AMT105 Tester
    • Disperesing Stages of AMT Tester
    • Introducing the Device and Equipment
    • Comparative Analysis of AMT105, AMT205, AMT103, and AMT203 Devices
    • AMPro Software Translation
  • Software Installation and Connection Setting
    • Software Installation
    • How to Connect to AMT
    • Simultaneous Connection of Several Testers
    • Resetting IP Address
    • Updating Firmware of Device Manually
  • Default Setting
    • General Setting of Rooms
    • General Setting of Rooms, Part2
    • Default Setting for “Report”
    • Preferences Page "Directory" & "Cash" Tab
    • "Connection & Firmware"Tab
    • Device Hardware Setting
    • Modifying and Improving the Translation of the Vebko Amirkabir Company Website
    • Power Control and Its Relation to Heat
    • Modifying and Improving AMPro Software Translation
  • Software Home Page
    • General Types of Rooms
    • Software Start Page
  • Modules Toolbar and Statusbar
    • Toolbar and Status Bar, Part 1
    • Toolbar and Status Bar, Part 2
    • “New Based on Custom Template” Option
    • Determining Decimal Numbers, Part 1
    • Determining Decimal Numbers Part 2
    • Analog Output Setting
    • Binary Input Setting, Part1
    • Binary Input Setting, Part2
    • Binary Output’S Setting
    • Extra Setting
    • Relay Specification in Test Object
    • Introducing the “RIO”
    • Introducing “XRIO”
    • XRIO Converter File
    • XRIO Converter, Part2
    • Complementary Explanation About “XRIO Converter”
    • XRIO and XRIO Converter
    • XRIO & Relay Setting in the Software
    • XRIO Converter Formula Writing
    • Writing “XRIO Converter” for an Overcurrent Relay
    • Writing Formula for the “XRIO Converter” 3
    • Writing Formula for “XRIO Converter”4
    • Writing Formula for “XRIO Converter”5
    • Complementary Explanations of “Device” Section
  • AMT Sequencer Module
    • An Introduction to the Sequencer Room
    • “Table View” Window
    • The Separate Toolbar of “Table View” Window
    • “Detail View” Tab
    • Analog Out Tab
    • Quick Type
    • Step Ramp Type
    • Continuous Ramp Type
    • Harmonic State
    • The “Transient” State Type:
    • The “Transient” State (Observing the Impedance Trajectory)
    • The "Transient" State (Observing the Differential Trajectory)
    • “Tracking” State
    • "Set Mode and Fault Type" : Part 1
    • "Set Mode and Fault Type" : Part 2
    • Additional Settings of “Detail View”
    • "Signal View" Window Part 1
    • “Signal View” Window, Part 2
    • “Signal View” Setting, Part 1
    • “Signal View” Setting, Part 2
    • ”Vector View” Window, Part 1
    • “Vector View” Window, Part 2
    • “Vector View” Window, Part 3
    • “Measurement View” Window, Part1
    • “Level Assessment” Tab
    • “Ramp Assessment” Tab
    • “Value Assessment” Tab
    • “Calculated Assessment” Tab
    • "Transient Assessment" Tab
    • Running the Test
    • Start-Condition-Repetition" Window
    • “Report Setting” Window
    • “Report View” Window
    • Advanced Settings of “Report” Part 1
    • Advanced Settings of “Report” Part 2
    • Abilty to Convert Output Binary Voltage to Current and Vice Versa
    • Sampled Value
  • AMT Overcurrent Module
    • Introducing Over Current Room
    • Relay Settings in the "Overcurrent" Room – Part 1
    • Relay Settings in the "Overcurrent" Room – Part 2
    • Relay Settings in “Overcurrent” Room, Part 3
    • Relay Settings in the "Overcurrent" Room – Part 4
    • Test View Window
    • “Pick Up-Drop Off” Window
    • “Overcurrent” Characteristic Curve
    • “Settings” Tab of “Overcurrent” Module, Part 1
    • “Settings” Tab of “Overcurrent” Module, Part 2
    • Directional Earth Fault
    • Complementary Explanation of “Overcurrent” Room
    • Directional Overcurrent
  • AMT VI STARTING Module
    • Introducing “VI Starting” Room
    • “Shot Test” Tab
    • “Check Test” Tab
    • "VI Starting" Room Setting
  • AMT Distance Module
    • Introducing “Distance” Room, Part 1
    • Introducing “Distance” Room, Part 2
    • Introducing “Distance” Room, Part 3
    • Introducing “Testview” Window in “Distance” Room, Part 1
    • “Check Test” Tab
    • “Search Test” Tab
    • “Distance” Room Settings, Part 1
    • “Distance” Room Settings, Part 2
    • Impedance View Window
    • “Zt Diagram” and “Medium Detail View” Windows
    • Grounding Factor in Distance
    • Distance Protection Voltage and Current Calculations in the Test Room
  • AMT Differential Module
    • Relay Settings in “Differential” Room, Part 1
    • Relay Settings in “Differential” Room, Part 2
    • Introducing “Test View” Window in “Differential” Room, Part 1
    • Introducing “Test View” Window in “Differential” Room, Part 2
    • “Differential” Room Settings
    • “Differential Characteristic” Window
    • No Combined Characteristic
    • Zero Sequence Elimination
    • Restricted Earth Fault
  • AMT Diff Harmonics Module
    • Introducing “AMT Diff. Harmonics” Room
    • “Test View” Window
    • “Setting” Tab
    • “Harmonic Restraint View” Window
  • AMT Transducer Module
    • “Offload” Test Part 1
    • “Offload” Test Part 2
    • “Onload” Test of the Meter
    • Transducer Test
    • How to Use the Optical Pulse Sensor in Meter Testing
  • AMT Synchronizer Module
    • An Introduction to AMT Synchronizer
    • Test View Window in Synchronizer Room
  • AMT VCC Room
    • AMT VCC Room
  • Current Transformer Module
    • Introducing “Current Transformer (CT)” Room
    • Secondary Burden Test
    • Winding Resistance Test
    • “Excitation Test” Tab, Part 1
    • “Excitation Test” Tab, Part 2
    • CT “Excitation Test”, Part 3
    • CT Excitation Test, Part 4
    • Other Tests Performable in “Excitation Test” Tab
    • CT Ratio and Polarity Test with Current Method
    • CT Ratio and Polarity Test (with Voltage)
    • CT Test Wiring Guide Using the Instrument Module
    • CT and PT Turns Ratio
    • Estimating FS and ALF for Various CTs
  • Circuit Breaker Module
    • Introducing “Circuit Breaker(CB)” Room
    • CB “Timing Test”
    • “Contact Resistance” Tab
    • Circuit Breaker Operation Minimum Voltage Test:
    • A Guide for Performing CB Test Connections Using the Instrument Module
  • capacitor voltage transformer
    • Capacitive Voltage Transformers
    • Secondary Burden Test
    • Short-Circuit Impedance Tab
    • Winding Resistance Test
    • Excitation Tab
    • CVT Ratio2
    • Ratio Tab
    • A Guide for Cvt Test Wiring Using the Instrument Module
  • Transformer Module
    • Introducing “Transformer” Room
    • “Vector Group, Turns Ratio and No Load” Tab
    • “Magnetic Balance” Tab
    • “Winding Resistance” Tab
    • “Leakage Reactance“ Tab
    • “Demagnitize” Tab
    • Guide to Performing Transformer Test Using Instrument Module
    • Zero Sequence Elimination
    • How to Use Clamps in Transformer Testing
  • OverCurrent Quick Test Room
    • Overcurrent Quick Test Room
  • Under OverVoltage Test Room
    • Under Over Voltage Test Room
  • AMT AR Room
    • AMT Ar Room
  • Resistance Test
    • Resistance Test
  • Troubleshooting
    • The Complete Main Switching
    • Main Switching Error Overcurrent Board
    • Overcurrent Error of Board 2 Part 1
    • Overcurrent Error Board 2 Part2
    • Switching Troubleshooting
    • OC Board IGBT Test
    • Introducing the Internal Modules Part1
    • Introduceing Internal Modules Part2
    • Introducing Internal Modules Part3
    • Switching Module
    • Possible Errors in the Switching Module
    • Checking the Parts,in Switching Module Errors Part1
    • Checking the Parts,in Switching Module Errors Part2
    • Checking the Parts,in Switching Module Errors Part3
    • The Connections Between the Switching Module and the Amplifier
  • Testing of relays protection functions
    • End-to-End Test
    • Overvoltage Protection Function Test in MICOM P141 Relay
    • Undervoltage Protection Function Test in MICOM P141 Relay
    • Directional Overcurrent Protection Function Test in MICOM P141 Relay
    • Directional Earth Fault (DEF) Protection Function Test in MICOM P141 Relay
    • New End-to-End Test
    • Drawing the Distance Characteristics and Practical Example of Drawing the Quad Characteristic in Siemens 7SA522 Relay
    • Drawing the Load Encroachment Characteristic
    • Drawing the Mho Characteristic in GEC PYTC Relay
    • Synchronizer Function Test in SIPROTEC Siemens 7SD82 Relay
    • 51V Function Test in Siemens 7SD82 Relay
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Rogowski Coil Test
  • ZA
  • Goose Messaging Testing
    • GOOSE Messaging Testing
  • Trust the Software
    • Guide to Trusting Vebko(Stable-Test) Software in Bitdefender Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in Kaspersky Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in NOD32 Antivirus
  • PMU Test
    • PMU Test
  • ZE
  • Introdusing Company and Produces
    • Assembly Stages of AMR Relay
  • Software Download and Installation
    • Software Installation
  • Software Homepage and Create Project
    • Login to the Main Environment of the Software
  • Connection and Update Firmware
    • Connect with Relay
    • Firmware Relay Update
  • Relay Hardware
    • Relay Hardware Module
    • Voltage and Current Transformers Data
  • AMR Relay Test
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
  • Real Testing Requires Realistic Signals
  • AMPro Protocol Sniffer
  • Meet SV100+
  • IEC 61850 Sampled Values Testing
  • Digital substations run at the speed of light
  • Don’t Just Test Your Relays. Simulate the Grid
  • Smart Configuration Inheritance in VCC — With Full Control
  • Control What Appears in Your Test Report
  • From Comtrade to Inject
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • One State. Four Transitions. Total Control
  • Stop waiting for the test to finish
  • Balanced System, Zero Trip, Infinite Confidence
  • Defining Complex Logic For Assessments
  • Advanced Assessments
  • Vebko Around The World
  • Noise Suppression in Transformer Turns Ratio
  • Relay Data in Quick Access
  • Wiring Clarity - Without Leaving Your Workspace
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • Flexible Connectivity with AMT205 in AMPRO
  • Simultaneous Ramp on All Outputs [AMT205]
  • Continuous Ramp Capability [AMT205]
  • Distance Search Testing
  • Comprehensive Circuit Breaker Testing [AMT205]
  • Smarter Configuration In VCC File
  • New Feature In Vebko AMPro
  • Vebko Educational Videos
  • Contact Resistance Measurement
  • Test With Confidence
  • Control Your Report
  • One Device, Any Relay
  • DC Resistance Measurement
  • History of Amt105 GPS
  • History of Amt105 Wifi
  • AMT 105 Features
  • Catalog
    • Catalog All
    • Accessories
    • Agencies
    • Catalog
    • Hardware
  • PDF Download PDF
    0 / 0

    "VI Starting" Room Setting

    To continue with explaining “VI Starting” room, in this video we are going to explain “Setting” tab. you can adjust some of the test settings. In this tab, In “Time” section, first, the injection time before fault in “PreFault Time” is entered. In “Max Fault Time”, the maximum fault injection time is specified in the form of “Abs” or “Rel” which itself includes three sections. Note that if the time specified in “Max Fault Time” is shorter than time of the “Pick up” time of the shot point, result of the evaluation will be wrong.

    If you are using “Max Fault Time (Abs)” field, you need to enter a time in terms of seconds for the maximum fault signal injection time (for all points). But, to increase the speed of the test, you can use “Max Fault Time (Rel)”. By checking this option, three other options appear. By entering a number in “Add%ofTnom”, the fault signal injection time in each point equals the test point nominal time plus a percentage of the nominal time entered in this field. This means that if the test point nominal time is 10 seconds and 5 percent is entered in this field, the maximum fault injection time (105) percent of the test nominal time which is 10.5 seconds. But in “Add Absolute” field, the fault injection time is entered as a sum of the test point trip nominal time plus the time entered in this field. For points which are in “No Trip” area, it is possible to enter a separate time in “No-Trip Time” field. If you enter the time in these four fields, the software will consider the longest time.

    “Post Fault” time is entered in “Post Fault Time”. “Delay After Trigger” is used for specifying the trigger time of the intended key and by right-clicking on the related field and selecting “Go To Linked Value”, you can see that it is linked to “CB Trip Time” and if necessary, by selecting “Remove Link” you can enter your desired value instead. In “Load Current (PreFault Current)” section, it is possible to adjust the settings related to “PreFault” phase and current. By selecting “Based on Current” radio button in “Amplitude” section, the “PreFault” current is entered in ampere which is the same for all other test points. But, by selecting “Based on IFault”, the “PreFault” current is entered in fault current which is different for every “Shot” point. You can use “Phase” section for the angle between current and voltage in “PreFault”. By selecting the “Based on Degree” radio button, it is possible to specify the voltage current angle in degrees which is the same for all other test points. But, by selecting “Same as Fault Angle”, the angle between current and voltage in “PreFault” will be the same with “Fault” which is different for every “Shot” point.

    In “Search Setting” section, the settings related to “Search Test” are specified. As mentioned before, “Search Test” gives a result when one of these conditions are met.

    The first condition is “Relative” meaning if the difference between the test point value and previous test point is less than the percentage specified in this field, this point is the response of the test.

    The second condition is “Absolute” meaning if the difference between the test point and previous point is less than the value specified in this field, this point is the response of the test.

    And the third condition is “Max Point Number” meaning the test cannot be performed more than the number of points entered in this field and the last point is the response of the test.

    But, if for any reasons, the nominal characteristic specified for the test is not available, you can use the “Ignore Nominal Characteristic” section. By doing so, the software ignores the current characteristic. Then, according to the steps entered in “Search Interval”, shots are added to the "Search" line. For example, in “Search Test” section, a line is drawn. Then, 0.5 is entered in “Search Interval” and “Apply to all” is selected. You can see that points with this step are shot on the “Search” line. By performing the test, you can see that it starts from the lowest point and when one of the three mentioned conditions is met, the test gives a result. If necessary, it is possible to disable this option by selecting “Disable all”.

    In “Trigger” tab, you can select your intended binary to receive the “Pick up” signal, cutting the injection of current and voltage. The explanation and settings of this section are the same as those for “Trigger” in “Sequencer” room. In “Binary Output” tab, if it is necessary for the relay to see the key condition, by using the “A” or “B” group voltages or “Aux DC” it is possible to take any needed voltage to the “Binary Input” of the relay through “Binary Output” of the device. This tab has three “PreFault”, Fault” and “Post Fault” modes and you can specify the settings of each one separately.

     [jg1]VI_Starting_Room_Setting

    Related topics

    • “Shot Test” Tab AMT VI STARTING Module
    • “Check Test” Tab AMT VI STARTING Module
    • “Distance” Room Settings, Part 2 AMT Distance Module
    • “Differential” Room Settings AMT Differential Module
    • “Setting” Tab AMT Diff Harmonics Module
    • “Settings” Tab of “Overcurrent” Module, Part 2 AMT Overcurrent Module
    • Introducing “Testview” Window in “Distance” Room, Part 1 AMT Distance Module
    • “Test View” Window AMT Diff Harmonics Module
    Sharing Window
    Telegram Telegram WhatsApp WhatsApp Eitaa Eitaa FaceBook FaceBook Linkedin Linkedin X X
    "VI Starting" Room Setting
    Tap play once on mobile if autoplay is blocked.
    En Fa De Tr Mu
    MP4
    MP3
    SRT
    DOC