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  • VEBKO

  • Introducing the Company and Products
    • Assembling Stages of AMT105 Tester
    • Disperesing Stages of AMT Tester
    • Introducing the Device and Equipment
    • Comparative Analysis of AMT105, AMT205, AMT103, and AMT203 Devices
    • AMPro Software Translation
  • Software Installation and Connection Setting
    • Software Installation
    • How to Connect to AMT
    • Simultaneous Connection of Several Testers
    • Resetting IP Address
    • Updating Firmware of Device Manually
  • Default Setting
    • General Setting of Rooms
    • General Setting of Rooms, Part2
    • Default Setting for “Report”
    • Preferences Page "Directory" & "Cash" Tab
    • "Connection & Firmware"Tab
    • Device Hardware Setting
    • Modifying and Improving the Translation of the Vebko Amirkabir Company Website
    • Power Control and Its Relation to Heat
    • Modifying and Improving AMPro Software Translation
  • Software Home Page
    • General Types of Rooms
    • Software Start Page
  • Modules Toolbar and Statusbar
    • Toolbar and Status Bar, Part 1
    • Toolbar and Status Bar, Part 2
    • “New Based on Custom Template” Option
    • Determining Decimal Numbers, Part 1
    • Determining Decimal Numbers Part 2
    • Analog Output Setting
    • Binary Input Setting, Part1
    • Binary Input Setting, Part2
    • Binary Output’S Setting
    • Extra Setting
    • Relay Specification in Test Object
    • Introducing the “RIO”
    • Introducing “XRIO”
    • XRIO Converter File
    • XRIO Converter, Part2
    • Complementary Explanation About “XRIO Converter”
    • XRIO and XRIO Converter
    • XRIO & Relay Setting in the Software
    • XRIO Converter Formula Writing
    • Writing “XRIO Converter” for an Overcurrent Relay
    • Writing Formula for the “XRIO Converter” 3
    • Writing Formula for “XRIO Converter”4
    • Writing Formula for “XRIO Converter”5
    • Complementary Explanations of “Device” Section
  • AMT Sequencer Module
    • An Introduction to the Sequencer Room
    • “Table View” Window
    • The Separate Toolbar of “Table View” Window
    • “Detail View” Tab
    • Analog Out Tab
    • Quick Type
    • Step Ramp Type
    • Continuous Ramp Type
    • Harmonic State
    • The “Transient” State Type:
    • The “Transient” State (Observing the Impedance Trajectory)
    • The "Transient" State (Observing the Differential Trajectory)
    • “Tracking” State
    • "Set Mode and Fault Type" : Part 1
    • "Set Mode and Fault Type" : Part 2
    • Additional Settings of “Detail View”
    • "Signal View" Window Part 1
    • “Signal View” Window, Part 2
    • “Signal View” Setting, Part 1
    • “Signal View” Setting, Part 2
    • ”Vector View” Window, Part 1
    • “Vector View” Window, Part 2
    • “Vector View” Window, Part 3
    • “Measurement View” Window, Part1
    • “Level Assessment” Tab
    • “Ramp Assessment” Tab
    • “Value Assessment” Tab
    • “Calculated Assessment” Tab
    • "Transient Assessment" Tab
    • Running the Test
    • Start-Condition-Repetition" Window
    • “Report Setting” Window
    • “Report View” Window
    • Advanced Settings of “Report” Part 1
    • Advanced Settings of “Report” Part 2
    • Abilty to Convert Output Binary Voltage to Current and Vice Versa
    • Sampled Value
  • AMT Overcurrent Module
    • Introducing Over Current Room
    • Relay Settings in the "Overcurrent" Room – Part 1
    • Relay Settings in the "Overcurrent" Room – Part 2
    • Relay Settings in “Overcurrent” Room, Part 3
    • Relay Settings in the "Overcurrent" Room – Part 4
    • Test View Window
    • “Pick Up-Drop Off” Window
    • “Overcurrent” Characteristic Curve
    • “Settings” Tab of “Overcurrent” Module, Part 1
    • “Settings” Tab of “Overcurrent” Module, Part 2
    • Directional Earth Fault
    • Complementary Explanation of “Overcurrent” Room
    • Directional Overcurrent
  • AMT VI STARTING Module
    • Introducing “VI Starting” Room
    • “Shot Test” Tab
    • “Check Test” Tab
    • "VI Starting" Room Setting
  • AMT Distance Module
    • Introducing “Distance” Room, Part 1
    • Introducing “Distance” Room, Part 2
    • Introducing “Distance” Room, Part 3
    • Introducing “Testview” Window in “Distance” Room, Part 1
    • “Check Test” Tab
    • “Search Test” Tab
    • “Distance” Room Settings, Part 1
    • “Distance” Room Settings, Part 2
    • Impedance View Window
    • “Zt Diagram” and “Medium Detail View” Windows
    • Grounding Factor in Distance
    • Distance Protection Voltage and Current Calculations in the Test Room
  • AMT Differential Module
    • Relay Settings in “Differential” Room, Part 1
    • Relay Settings in “Differential” Room, Part 2
    • Introducing “Test View” Window in “Differential” Room, Part 1
    • Introducing “Test View” Window in “Differential” Room, Part 2
    • “Differential” Room Settings
    • “Differential Characteristic” Window
    • No Combined Characteristic
    • Zero Sequence Elimination
    • Restricted Earth Fault
  • AMT Diff Harmonics Module
    • Introducing “AMT Diff. Harmonics” Room
    • “Test View” Window
    • “Setting” Tab
    • “Harmonic Restraint View” Window
  • AMT Transducer Module
    • “Offload” Test Part 1
    • “Offload” Test Part 2
    • “Onload” Test of the Meter
    • Transducer Test
    • How to Use the Optical Pulse Sensor in Meter Testing
  • AMT Synchronizer Module
    • An Introduction to AMT Synchronizer
    • Test View Window in Synchronizer Room
  • AMT VCC Room
    • AMT VCC Room
  • Current Transformer Module
    • Introducing “Current Transformer (CT)” Room
    • Secondary Burden Test
    • Winding Resistance Test
    • “Excitation Test” Tab, Part 1
    • “Excitation Test” Tab, Part 2
    • CT “Excitation Test”, Part 3
    • CT Excitation Test, Part 4
    • Other Tests Performable in “Excitation Test” Tab
    • CT Ratio and Polarity Test with Current Method
    • CT Ratio and Polarity Test (with Voltage)
    • CT Test Wiring Guide Using the Instrument Module
    • CT and PT Turns Ratio
    • Estimating FS and ALF for Various CTs
  • Circuit Breaker Module
    • Introducing “Circuit Breaker(CB)” Room
    • CB “Timing Test”
    • “Contact Resistance” Tab
    • Circuit Breaker Operation Minimum Voltage Test:
    • A Guide for Performing CB Test Connections Using the Instrument Module
  • capacitor voltage transformer
    • Capacitive Voltage Transformers
    • Secondary Burden Test
    • Short-Circuit Impedance Tab
    • Winding Resistance Test
    • Excitation Tab
    • CVT Ratio2
    • Ratio Tab
    • A Guide for Cvt Test Wiring Using the Instrument Module
  • Transformer Module
    • Introducing “Transformer” Room
    • “Vector Group, Turns Ratio and No Load” Tab
    • “Magnetic Balance” Tab
    • “Winding Resistance” Tab
    • “Leakage Reactance“ Tab
    • “Demagnitize” Tab
    • Guide to Performing Transformer Test Using Instrument Module
    • Zero Sequence Elimination
    • How to Use Clamps in Transformer Testing
  • OverCurrent Quick Test Room
    • Overcurrent Quick Test Room
  • Under OverVoltage Test Room
    • Under Over Voltage Test Room
  • AMT AR Room
    • AMT Ar Room
  • Resistance Test
    • Resistance Test
  • Troubleshooting
    • The Complete Main Switching
    • Main Switching Error Overcurrent Board
    • Overcurrent Error of Board 2 Part 1
    • Overcurrent Error Board 2 Part2
    • Switching Troubleshooting
    • OC Board IGBT Test
    • Introducing the Internal Modules Part1
    • Introduceing Internal Modules Part2
    • Introducing Internal Modules Part3
    • Switching Module
    • Possible Errors in the Switching Module
    • Checking the Parts,in Switching Module Errors Part1
    • Checking the Parts,in Switching Module Errors Part2
    • Checking the Parts,in Switching Module Errors Part3
    • The Connections Between the Switching Module and the Amplifier
  • Testing of relays protection functions
    • End-to-End Test
    • Overvoltage Protection Function Test in MICOM P141 Relay
    • Undervoltage Protection Function Test in MICOM P141 Relay
    • Directional Overcurrent Protection Function Test in MICOM P141 Relay
    • Directional Earth Fault (DEF) Protection Function Test in MICOM P141 Relay
    • New End-to-End Test
    • Drawing the Distance Characteristics and Practical Example of Drawing the Quad Characteristic in Siemens 7SA522 Relay
    • Drawing the Load Encroachment Characteristic
    • Drawing the Mho Characteristic in GEC PYTC Relay
    • Synchronizer Function Test in SIPROTEC Siemens 7SD82 Relay
    • 51V Function Test in Siemens 7SD82 Relay
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Rogowski Coil Test
  • ZA
  • Goose Messaging Testing
    • GOOSE Messaging Testing
  • Trust the Software
    • Guide to Trusting Vebko(Stable-Test) Software in Bitdefender Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in Kaspersky Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in NOD32 Antivirus
  • PMU Test
    • PMU Test
  • ZE
  • Introdusing Company and Produces
    • Assembly Stages of AMR Relay
  • Software Download and Installation
    • Software Installation
  • Software Homepage and Create Project
    • Login to the Main Environment of the Software
  • Connection and Update Firmware
    • Connect with Relay
    • Firmware Relay Update
  • Relay Hardware
    • Relay Hardware Module
    • Voltage and Current Transformers Data
  • AMR Relay Test
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
  • Real Testing Requires Realistic Signals
  • AMPro Protocol Sniffer
  • Meet SV100+
  • IEC 61850 Sampled Values Testing
  • Digital substations run at the speed of light
  • Don’t Just Test Your Relays. Simulate the Grid
  • Smart Configuration Inheritance in VCC — With Full Control
  • Control What Appears in Your Test Report
  • From Comtrade to Inject
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • One State. Four Transitions. Total Control
  • Stop waiting for the test to finish
  • Balanced System, Zero Trip, Infinite Confidence
  • Defining Complex Logic For Assessments
  • Advanced Assessments
  • Vebko Around The World
  • Noise Suppression in Transformer Turns Ratio
  • Relay Data in Quick Access
  • Wiring Clarity - Without Leaving Your Workspace
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • Flexible Connectivity with AMT205 in AMPRO
  • Simultaneous Ramp on All Outputs [AMT205]
  • Continuous Ramp Capability [AMT205]
  • Distance Search Testing
  • Comprehensive Circuit Breaker Testing [AMT205]
  • Smarter Configuration In VCC File
  • New Feature In Vebko AMPro
  • Vebko Educational Videos
  • Contact Resistance Measurement
  • Test With Confidence
  • Control Your Report
  • One Device, Any Relay
  • DC Resistance Measurement
  • History of Amt105 GPS
  • History of Amt105 Wifi
  • AMT 105 Features
  • Catalog
    • Catalog All
    • Accessories
    • Agencies
    • Catalog
    • Hardware
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    “Signal View” Setting, Part 2

    The “Operation” part is used when the user decides to conduct a computational operation on the existing signals. At first, the number of the required “Operations” is entered and clicking on “Initiate” creates the “Operations”. Here the number 3 was entered. A separate section is opened for each “Operation” and the given “Operation” can be deleted by clicking on the red Cross mark in the corner of the box.

    In the “Operation Mode” part, it is found that with what kind of signal the “Operation” is performed, analog or “Dry”! If  “By Dry Value” is selected, the active “Binary Inputs” are shown in the table At first in “Hardware Configuration” page binaries “C3” & “C4” are  enabled that by using this option  you can see the binaries and determine a value for them, here value “5” is assigned for each of them.For each operation A “Calculated” option is added above “Setting” bar per “Operation”. By checking this option, the “Calculated” signal is displayed in “Signal View”. In this diagram, the values of the contacts that are connected are aggregated and displayed in the diagram; this is used to test capacitive banks. For example, you can observe that the values are added in staircase by receiving the contacts “C3” and “C4”.

    In the “Number of Signal” part, the number of signals used in “Operation” shows that 2 or 4 signals can be selected. In the dropdown field related to “Singnal 1” and “Singnal 2”, the given signals are assigned to them, and by checking “Advanced” option, a section is opened in which the signal information, such as the signal unit, can be determined. Additionally, by entering a value in “Coef.” field, the given signal is affected by a factor, and in the “Name” field, a name can be determined for signal. In the “Operation”dropdown field, the user determines the type of mathematical operation to be performed between signals. In the “Advanced” part of this field, a name can be determined for this action.

    After the “Operation” is specified, the “Add Time” part is added which can determine time intervals on the signal diagram. In order to make it clear, at first, the time state is set at 10 seconds in “detail view”, and the same intervals are determined on the signal by specifying a time of, for example, 2 seconds in “Auto Add Time” part. If the user intends to determine non-identical time intervals, by selecting “Add Time” a window with the same name is opened, and some rows are added by right-clicking upon it. The first column determines the “Operations” to be used for calculation of the values of this row.  In “Time” column, the given time is selected. In “Value” column, the value of “Operation” in the given time is calculated. The “Slope” column is the gradient column. In “Sig1” and “Sig2” columns, the values of signals at the given time are determined.

    In the “Show Signals” part, all parameters corresponding to the voltage and current in test are determined. This part includes some columns and at the beginning of each, the name of the relevant parameter is written. Each column contains some options. By selecting each option, the name of its box is added at the top of the “Setting” tab, and then, by checking this option, the corresponding “RMS”valus is displayed in the “Signal View”.

    When “Show Actual Value” option of “Binary Inputs” is set, two parts are added to “Setting” and “Signal View”, for example by checking “Binary-Input Target” option in the “Hardware Configuration” page and the “Binary/Analog Input” tab, all “Binary Inputs” are enabled. Then “Show Actual Value” option of one of them is set to “AC” (or DC) state and the “Show Actual Value” option of all enabled binaries is set at “AC” state upon right-clicking upon it and selecting “Set all Binary like this” option. You can observe that all “Binaries” have been added to the bar above “Setting”. By checking each of them, the corresponding signal can be seen in “Signal View”.

    In the “Select Graph For Actual Binary” part, you can select other signals in the proprietary graphs of each “Binary Inputs” whose “Show Actual Value” is enabled to be displayed. In addition to displaying their signals, the “Binary Inputs” are also shown in the graph. This way, a comparison can be made between the “Binary Input” signal and other signal. For example, here we determine that in addition to displaying trip signal, Start” and “VL1-E” signals are also shown in “C1” signal diagram. Additionally, the signal name can be changed. Then by selecting the name on the bar above “Setting”, the signals can be observed.

    In “Binary (Analog) Transformer” part, the user can aggregate the signal with a constant value, multiply it by a factor, or apply a phase shift to it. The user may intend to introduce another parameter by applying these factors to the given parameter, for example, if the voltage signal is obtained by multiplying the current signal by 2 and aggregating it with value 3, the introduced parameter will be voltage parameter by selecting the “Voltage” option.

     [jg1]Signal_View_Setting_part2

    Related topics

    • "Set Mode and Fault Type" : Part 1 AMT Sequencer Module
    • "Signal View" Window Part 1 AMT Sequencer Module
    • Continuous Ramp Type AMT Sequencer Module
    • “Signal View” Setting, Part 1 AMT Sequencer Module
    • The “Transient” State Type: AMT Sequencer Module
    • “Vector View” Window, Part 3 AMT Sequencer Module
    • “Table View” Window AMT Sequencer Module
    • “Signal View” Window, Part 2 AMT Sequencer Module
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