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  • VEBKO

  • Introducing the Company and Products
    • Assembling Stages of AMT105 Tester
    • Disperesing Stages of AMT Tester
    • Introducing the Device and Equipment
    • Comparative Analysis of AMT105, AMT205, AMT103, and AMT203 Devices
    • AMPro Software Translation
  • Software Installation and Connection Setting
    • Software Installation
    • How to Connect to AMT
    • Simultaneous Connection of Several Testers
    • Resetting IP Address
    • Updating Firmware of Device Manually
  • Default Setting
    • General Setting of Rooms
    • General Setting of Rooms, Part2
    • Default Setting for “Report”
    • Preferences Page "Directory" & "Cash" Tab
    • "Connection & Firmware"Tab
    • Device Hardware Setting
    • Modifying and Improving the Translation of the Vebko Amirkabir Company Website
    • Power Control and Its Relation to Heat
    • Modifying and Improving AMPro Software Translation
  • Software Home Page
    • General Types of Rooms
    • Software Start Page
  • Modules Toolbar and Statusbar
    • Toolbar and Status Bar, Part 1
    • Toolbar and Status Bar, Part 2
    • “New Based on Custom Template” Option
    • Determining Decimal Numbers, Part 1
    • Determining Decimal Numbers Part 2
    • Analog Output Setting
    • Binary Input Setting, Part1
    • Binary Input Setting, Part2
    • Binary Output’S Setting
    • Extra Setting
    • Relay Specification in Test Object
    • Introducing the “RIO”
    • Introducing “XRIO”
    • XRIO Converter File
    • XRIO Converter, Part2
    • Complementary Explanation About “XRIO Converter”
    • XRIO and XRIO Converter
    • XRIO & Relay Setting in the Software
    • XRIO Converter Formula Writing
    • Writing “XRIO Converter” for an Overcurrent Relay
    • Writing Formula for the “XRIO Converter” 3
    • Writing Formula for “XRIO Converter”4
    • Writing Formula for “XRIO Converter”5
    • Complementary Explanations of “Device” Section
  • AMT Sequencer Module
    • An Introduction to the Sequencer Room
    • “Table View” Window
    • The Separate Toolbar of “Table View” Window
    • “Detail View” Tab
    • Analog Out Tab
    • Quick Type
    • Step Ramp Type
    • Continuous Ramp Type
    • Harmonic State
    • The “Transient” State Type:
    • The “Transient” State (Observing the Impedance Trajectory)
    • The "Transient" State (Observing the Differential Trajectory)
    • “Tracking” State
    • "Set Mode and Fault Type" : Part 1
    • "Set Mode and Fault Type" : Part 2
    • Additional Settings of “Detail View”
    • "Signal View" Window Part 1
    • “Signal View” Window, Part 2
    • “Signal View” Setting, Part 1
    • “Signal View” Setting, Part 2
    • ”Vector View” Window, Part 1
    • “Vector View” Window, Part 2
    • “Vector View” Window, Part 3
    • “Measurement View” Window, Part1
    • “Level Assessment” Tab
    • “Ramp Assessment” Tab
    • “Value Assessment” Tab
    • “Calculated Assessment” Tab
    • "Transient Assessment" Tab
    • Running the Test
    • Start-Condition-Repetition" Window
    • “Report Setting” Window
    • “Report View” Window
    • Advanced Settings of “Report” Part 1
    • Advanced Settings of “Report” Part 2
    • Abilty to Convert Output Binary Voltage to Current and Vice Versa
    • Sampled Value
  • AMT Overcurrent Module
    • Introducing Over Current Room
    • Relay Settings in the "Overcurrent" Room – Part 1
    • Relay Settings in the "Overcurrent" Room – Part 2
    • Relay Settings in “Overcurrent” Room, Part 3
    • Relay Settings in the "Overcurrent" Room – Part 4
    • Test View Window
    • “Pick Up-Drop Off” Window
    • “Overcurrent” Characteristic Curve
    • “Settings” Tab of “Overcurrent” Module, Part 1
    • “Settings” Tab of “Overcurrent” Module, Part 2
    • Directional Earth Fault
    • Complementary Explanation of “Overcurrent” Room
    • Directional Overcurrent
  • AMT VI STARTING Module
    • Introducing “VI Starting” Room
    • “Shot Test” Tab
    • “Check Test” Tab
    • "VI Starting" Room Setting
  • AMT Distance Module
    • Introducing “Distance” Room, Part 1
    • Introducing “Distance” Room, Part 2
    • Introducing “Distance” Room, Part 3
    • Introducing “Testview” Window in “Distance” Room, Part 1
    • “Check Test” Tab
    • “Search Test” Tab
    • “Distance” Room Settings, Part 1
    • “Distance” Room Settings, Part 2
    • Impedance View Window
    • “Zt Diagram” and “Medium Detail View” Windows
    • Grounding Factor in Distance
    • Distance Protection Voltage and Current Calculations in the Test Room
  • AMT Differential Module
    • Relay Settings in “Differential” Room, Part 1
    • Relay Settings in “Differential” Room, Part 2
    • Introducing “Test View” Window in “Differential” Room, Part 1
    • Introducing “Test View” Window in “Differential” Room, Part 2
    • “Differential” Room Settings
    • “Differential Characteristic” Window
    • No Combined Characteristic
    • Zero Sequence Elimination
    • Restricted Earth Fault
  • AMT Diff Harmonics Module
    • Introducing “AMT Diff. Harmonics” Room
    • “Test View” Window
    • “Setting” Tab
    • “Harmonic Restraint View” Window
  • AMT Transducer Module
    • “Offload” Test Part 1
    • “Offload” Test Part 2
    • “Onload” Test of the Meter
    • Transducer Test
    • How to Use the Optical Pulse Sensor in Meter Testing
  • AMT Synchronizer Module
    • An Introduction to AMT Synchronizer
    • Test View Window in Synchronizer Room
  • AMT VCC Room
    • AMT VCC Room
  • Current Transformer Module
    • Introducing “Current Transformer (CT)” Room
    • Secondary Burden Test
    • Winding Resistance Test
    • “Excitation Test” Tab, Part 1
    • “Excitation Test” Tab, Part 2
    • CT “Excitation Test”, Part 3
    • CT Excitation Test, Part 4
    • Other Tests Performable in “Excitation Test” Tab
    • CT Ratio and Polarity Test with Current Method
    • CT Ratio and Polarity Test (with Voltage)
    • CT Test Wiring Guide Using the Instrument Module
    • CT and PT Turns Ratio
    • Estimating FS and ALF for Various CTs
  • Circuit Breaker Module
    • Introducing “Circuit Breaker(CB)” Room
    • CB “Timing Test”
    • “Contact Resistance” Tab
    • Circuit Breaker Operation Minimum Voltage Test:
    • A Guide for Performing CB Test Connections Using the Instrument Module
  • capacitor voltage transformer
    • Capacitive Voltage Transformers
    • Secondary Burden Test
    • Short-Circuit Impedance Tab
    • Winding Resistance Test
    • Excitation Tab
    • CVT Ratio2
    • Ratio Tab
    • A Guide for Cvt Test Wiring Using the Instrument Module
  • Transformer Module
    • Introducing “Transformer” Room
    • “Vector Group, Turns Ratio and No Load” Tab
    • “Magnetic Balance” Tab
    • “Winding Resistance” Tab
    • “Leakage Reactance“ Tab
    • “Demagnitize” Tab
    • Guide to Performing Transformer Test Using Instrument Module
    • Zero Sequence Elimination
    • How to Use Clamps in Transformer Testing
  • OverCurrent Quick Test Room
    • Overcurrent Quick Test Room
  • Under OverVoltage Test Room
    • Under Over Voltage Test Room
  • AMT AR Room
    • AMT Ar Room
  • Resistance Test
    • Resistance Test
  • Troubleshooting
    • The Complete Main Switching
    • Main Switching Error Overcurrent Board
    • Overcurrent Error of Board 2 Part 1
    • Overcurrent Error Board 2 Part2
    • Switching Troubleshooting
    • OC Board IGBT Test
    • Introducing the Internal Modules Part1
    • Introduceing Internal Modules Part2
    • Introducing Internal Modules Part3
    • Switching Module
    • Possible Errors in the Switching Module
    • Checking the Parts,in Switching Module Errors Part1
    • Checking the Parts,in Switching Module Errors Part2
    • Checking the Parts,in Switching Module Errors Part3
    • The Connections Between the Switching Module and the Amplifier
  • Testing of relays protection functions
    • End-to-End Test
    • Overvoltage Protection Function Test in MICOM P141 Relay
    • Undervoltage Protection Function Test in MICOM P141 Relay
    • Directional Overcurrent Protection Function Test in MICOM P141 Relay
    • Directional Earth Fault (DEF) Protection Function Test in MICOM P141 Relay
    • New End-to-End Test
    • Drawing the Distance Characteristics and Practical Example of Drawing the Quad Characteristic in Siemens 7SA522 Relay
    • Drawing the Load Encroachment Characteristic
    • Drawing the Mho Characteristic in GEC PYTC Relay
    • Synchronizer Function Test in SIPROTEC Siemens 7SD82 Relay
    • 51V Function Test in Siemens 7SD82 Relay
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Rogowski Coil Test
  • ZA
  • Goose Messaging Testing
    • GOOSE Messaging Testing
  • Trust the Software
    • Guide to Trusting Vebko(Stable-Test) Software in Bitdefender Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in Kaspersky Antivirus
    • Guide to Trusting Vebko(Stable-Test) Software in NOD32 Antivirus
  • PMU Test
    • PMU Test
  • ZE
  • Introdusing Company and Produces
    • Assembly Stages of AMR Relay
  • Software Download and Installation
    • Software Installation
  • Software Homepage and Create Project
    • Login to the Main Environment of the Software
  • Connection and Update Firmware
    • Connect with Relay
    • Firmware Relay Update
  • Relay Hardware
    • Relay Hardware Module
    • Voltage and Current Transformers Data
  • AMR Relay Test
    • Differential Protection Test in AMR Relay (Simple Test Using Templates)
    • Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Negative Sequence Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Distance Protection Test in AMR Relay (Simple Test Using Templates)
    • Non-Directional Overcurrent Protection Test in AMR Relay (Simple Test Using Templates)
    • Overvoltage Protection Test in AMR Relay (Simple Test Using Templates)
    • Under Voltage Protection Test in AMR Relay (Simple Test Using Templates)
  • Real Testing Requires Realistic Signals
  • AMPro Protocol Sniffer
  • Meet SV100+
  • IEC 61850 Sampled Values Testing
  • Digital substations run at the speed of light
  • Don’t Just Test Your Relays. Simulate the Grid
  • Smart Configuration Inheritance in VCC — With Full Control
  • Control What Appears in Your Test Report
  • From Comtrade to Inject
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • One State. Four Transitions. Total Control
  • Stop waiting for the test to finish
  • Balanced System, Zero Trip, Infinite Confidence
  • Defining Complex Logic For Assessments
  • Advanced Assessments
  • Vebko Around The World
  • Noise Suppression in Transformer Turns Ratio
  • Relay Data in Quick Access
  • Wiring Clarity - Without Leaving Your Workspace
  • Design and Navigate Complex Test Procedures with the AMPRO Sequencer
  • Flexible Connectivity with AMT205 in AMPRO
  • Simultaneous Ramp on All Outputs [AMT205]
  • Continuous Ramp Capability [AMT205]
  • Distance Search Testing
  • Comprehensive Circuit Breaker Testing [AMT205]
  • Smarter Configuration In VCC File
  • New Feature In Vebko AMPro
  • Vebko Educational Videos
  • Contact Resistance Measurement
  • Test With Confidence
  • Control Your Report
  • One Device, Any Relay
  • DC Resistance Measurement
  • History of Amt105 GPS
  • History of Amt105 Wifi
  • AMT 105 Features
  • Catalog
    • Catalog All
    • Accessories
    • Agencies
    • Catalog
    • Hardware
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    “Table View” Window

    The first step in designing a test is to make different states of the test in “Table View” window. This means that to simulate fault state, it is necessary to inject signal several stage and receive feedback. Every stage of the test is showed on this window in form of a table named “state” and each “state” is made of several components.

    To open the “Table View” window, it is possible to use “View” menu or the toolbar at the top of the page. In the first part of every “state”, RMS value, phase and frequency of the outputs of the device, which are selected in “Hardware Configuration” part, are specified. In the first column of this part, the RMS value of the outputs of the device is specified. The maximum allowed value is determined in “Limits” section in “Test Object” page. In the second column, the phase of the output signals of the device is specified which can be between 0 to 360 degrees. Also, in the third column the frequency of the output signals of the device are specified which can be between 0 to 1.5 kHz. If DC signal is needed, the frequency should be specified as 0.

    In the “Bin. Out” section, the open/close state of “Binary Outputs” of the device is determined in accordance with the user’s wish. In the “Trigger” section, the conditions of “state” completion are determined which can be based on time, by pressing “space” button by the user and, also, based on receiving a specified signal from the relay or a combination of all three of these conditions. It is necessary to consider these two points:

    The first point is that in this section, it is possible to activate the related condition by double-clicking on any of the icons. To adjust the settings related to the “Inputs” you can do so from “Detail View” window or simply by checking “Trigger Condition” option.

    The second point: these conditions have “OR” logic with each other. This means that if several conditions are met, if one of them is true, the current “state” ends. In the next section the type of “state” is determined which can be selected from the available drop-down list. Note that each of these types is described in “Detail View” section. In “Bin. Input” section, the momentarily receival state of signal on every activated binary inputs is specified. In the “Comment” section, any important note about each “state” is recorded by the user. Note that entering information in this section is only possible in “Detail View” page.

    Right-click on “Table View” window

    By right-clicking on any column of the “Table View” window, a list containing several options opens. Each of these options is designed for a specific purpose. After right-clicking on the column related to “RMS” value, by selecting “Nominal Value”, the amount of current and voltage in each cell is changed to specified nominal values in “Device” block in “Test Object” page. By selecting “Zero” it is possible to set the cell value to zero. If the user wishes the voltage or current in all three phases to be equal to the selected cell value, they can select the “Equal Magnitudes” option. Also by checking “Link Magnitude” option, the values of all three phases will be linked together. It should be noted that if two groups of voltage or current are activated from “Hardware Configuration”, you can see that the three phases of group A are linked together while the three phases of Group B are linked together. To better understand this, enter 2amps as the current for one of the phases of group A and enter 4amps as the current for one of the phases of group B.

    The “100% Load” option is used for changing the current to nominal value. The “50% Load” option is used for changing the current to half of the nominal value and the “Unloaded” option is used for changing the current to zero. Note that by selecting any of these options, the voltage is changed to the nominal value.

    If the user copies the  values of voltage and current by right-clicking in “Vector View” window and selecting “Copy to Clipboard”, by selecting “Paste From Vector View Clipboard” in “Table View” window they can paste these values in their intended “state”. Also, by clicking on “L1L2L3->L3L1L2” option, the rotation of the phases as well as their values will change.

    “Link to XRio” option enables the user to relate the value of voltage, current, phase or frequency to any desired parameter in “XRio”. By selecting this option, “Link to XRio” window opens where the desired parameter can be selected. For example, in the “XRio” tree diagram in “Rio” section, in “Nominal Value” branch in “Device” block, the “In” parameter is selected. Also, it is possible to multiply the selected parameter by a specific value or add it to a specific value which is, finally, displayed in the box at the bottom. On the top right of this window it is possible to search a parameter. By checking “Filter by Sender Unit” on the left, all “XRio” parameters which have the same “unit” with the selected parameter in “Sequencer” are marked.

    After linking the intended voltage, you can see that the selected cell is turned purple which indicates that this cell is linked with a value from the “XRio”. By selecting “Go to Linked Value”, it is possible to view that the selected parameter in “Sequencer” is linked with which parameter in “XRio”.  If the user does not wish the parameter to be linked with “XRio”, it is possible to remove the link by selecting “Remove Link” option.

    By right-clicking on this column and selecting “Line Angle”, the angles of the selected voltage or current will equal with angle value of transmission line. It is possible to view and adjust this value in “Distance” block in “Test Object” page. By selecting “Zero”, it is possible to set the selected voltage or current to zero. If the user wishes to have the minimum amount of received current in the beginning of voltage injection, by selecting "90°" option, the phase of the injected voltage is set to 90 degrees. Balance Angle” option is selected for each cell, the related signal is selected as the reference signal and other phases are set at a degree with a 120 degrees, degree of difference with the reference signal.

    The “Reverse Rotation” option does the same in counterclockwise. This means that if this option is selected for a cell, regardless of its phase value, -120 degrees is Added to the next phase, respectively. By clicking on “Link angles (Equals)”, the angles of all three phases are equated and if one of them is changed, the others change accordingly. Also, the “Link angles (Balance)” option causes that if one of the phases is changed, the others change with a 120 degree difference.

    By selecting the “Nominal Value” from the options available for this column, the frequency value in each cell is changed to its nominal value in the “Device” block in the “Test Object” page. By selecting “DC”, the frequency is changed to zero and it is possible to produce “DC” signal.

    If the user wishes all the frequency values to be equal, the “Equal Frequency” option can be used. By selecting this option for any cell, the frequency of other signals is set equal to the selected cell."Link Frequency" links all values of the frequencies with each other. This means that if one of the frequencies is changed, the other frequencies change the same amount as well and all the signals will always have the same frequency. If you need signals with different frequencies, you should uncheck this option.

    Decaying signal

    If you wish to create “DC” decaying signal, after setting the frequency to zero, it is possible to enter the time constant in the phase column. As you know, the relation of a decaying signal is written as “A*e^(-t*T)”. In this relation “A” is amplitude while “T” is the opposite of time constant. This means that the number you enter is the “T”.

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     [jg1]Table_View_window

    Related topics

    • “Vector View” Window, Part 3 AMT Sequencer Module
    • “Report Setting” Window AMT Sequencer Module
    • Step Ramp Type AMT Sequencer Module
    • Quick Type AMT Sequencer Module
    • The “Transient” State Type: AMT Sequencer Module
    • ”Vector View” Window, Part 1 AMT Sequencer Module
    • “Signal View” Setting, Part 1 AMT Sequencer Module
    • “Distance” Room Settings, Part 1 AMT Distance Module
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